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[해외논문] Real Time Investigation of the Interface between a P3HT:PCBM Layer and an Al Electrode during Thermal Annealing

Macromolecular rapid communications, v.30 no.14, 2009년, pp.1269 - 1273  

Kim, Hyo Jung (OLED Center and Department of Materials Science and Engineering, Seoul National University, Seoul 151-742, Korea) ,  Lee, Hyun Hwi (Pohang Accelerator Laboratory, Pohang, Kyungbuk 790-783, Korea) ,  Kim, Jang-Joo (OLED Center and Department of Materials Science and Engineering, Seoul National University, Seoul 151-742, Korea)

Abstract AI-Helper 아이콘AI-Helper

Real time variation of the interfacial structure between an Al electrode and a poly(3-hexylthiophene) (P3HT):fullerene (PCBM) thin film during thermal annealing has been investigated using synchrotron X-rays. It is found that Al atoms diffuse into the organic layer to form a thin interlayer between ...

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참고문헌 (24)

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  24. H. J.Kim J. H.Park H. H.Lee D. R.Lee J.‐J.Kim unpublished results. 

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