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Journal of physics. D, applied physics, v.44 no.46, 2011년, pp.464003 -
Soergel, Elisabeth
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Piezoresponse force microscopy (PFM) detects the local piezoelectric deformation of a sample caused by an applied electric field from the tip of a scanning force microscope. PFM is able to measure deformations in the sub-picometre regime and can map ferroelectric domain patterns with a lateral resol...
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