[논문]Flicker removal for CMOS wide dynamic range imaging based on alternating current component analysis

Yoonjong Yoo; Jaehyun Im; Joonki Paik

doi:10.1109/TCE.2014.6937311

Flicker removal for CMOS wide dynamic range imaging based on alternating current component analysis

IEEE transactions on consumer electronics, v.60 no.3, 2014년, pp.294 - 301

Yoonjong Yoo (Dept. of Image, Chung-Ang Univ., Seoul, South Korea) , Jaehyun Im (Dept. of Image, Chung-Ang Univ., Seoul, South Korea) , Joonki Paik (Dept. of Image, Chung-Ang Univ., Seoul, South Korea)

Abstract ▼ AI-Helper

This paper presents a novel wide dynamic range system to reduce flickering artifact produced by a high speed electronic rolling shutter in a CMOS image sensor. The proposed algorithm removes flicker artifact in the shortexposure image using a correlation between the pair of two differently exposed images to extend the dynamic range. Since the proposed method overcomes the electronic shutter problem in a conventional wide dynamic range imaging system, it can remove the flicker artifact under an alternating current light source such as a fluorescent bulb.

참고문헌 (15)

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Flicker removal for CMOS wide dynamic range imaging based on alternating current component analysis

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Flicker removal for CMOS wide dynamic range imaging based on alternating current component analysis

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