$\require{mediawiki-texvc}$

연합인증

연합인증 가입 기관의 연구자들은 소속기관의 인증정보(ID와 암호)를 이용해 다른 대학, 연구기관, 서비스 공급자의 다양한 온라인 자원과 연구 데이터를 이용할 수 있습니다.

이는 여행자가 자국에서 발행 받은 여권으로 세계 각국을 자유롭게 여행할 수 있는 것과 같습니다.

연합인증으로 이용이 가능한 서비스는 NTIS, DataON, Edison, Kafe, Webinar 등이 있습니다.

한번의 인증절차만으로 연합인증 가입 서비스에 추가 로그인 없이 이용이 가능합니다.

다만, 연합인증을 위해서는 최초 1회만 인증 절차가 필요합니다. (회원이 아닐 경우 회원 가입이 필요합니다.)

연합인증 절차는 다음과 같습니다.

최초이용시에는
ScienceON에 로그인 → 연합인증 서비스 접속 → 로그인 (본인 확인 또는 회원가입) → 서비스 이용

그 이후에는
ScienceON 로그인 → 연합인증 서비스 접속 → 서비스 이용

연합인증을 활용하시면 KISTI가 제공하는 다양한 서비스를 편리하게 이용하실 수 있습니다.

Resistance switching mode transformation in SrRuO 3 /Cr-doped SrZrO 3 /Pt frameworks via a thermally activated Ti out-diffusion process 원문보기

Scientific reports, v.4, 2014년, pp.7354 -   

Jo, Yongcheol (Division of Physics and Semiconductor Science, Dongguk University , Seoul 100–) ,  Jung, Kyooho (715, Korea) ,  Kim, Jongmin (Division of Physics and Semiconductor Science, Dongguk University , Seoul 100–) ,  Woo, Hyeonseok (715, Korea) ,  Han, Jaeseok (Division of Physics and Semiconductor Science, Dongguk University , Seoul 100–) ,  Kim, Hyungsang (715, Korea) ,  Hong, Jinpyo (Division of Physics and Semiconductor Science, Dongguk University , Seoul 100–) ,  Lee, Jeon-Kook (715, Korea) ,  Im, Hyunsik (Division of Physics and Semiconductor Science, Dongguk University , Seoul 100–)

Abstract AI-Helper 아이콘AI-Helper

This work reports on a mechanism for irreversible resistive switching (RS) transformation from bipolar to unipolar RS behavior in SrRuO3 (SRO)/Cr-doped SrZrO3 (SZO:Cr)/Pt capacitor structures prepared on a Ti/SiO2/Si substrate. Counter-clockwise bipolar RS memory current-voltage (I–V) charact...

참고문헌 (33)

  1. Waser R. et al. Redox-Based resistive switching memories – nanoionic mechanisms, prospects, and challenges . Adv. Mater. 21 , 2632 – 2663 ( 2009 ). 

  2. Moreno C. et al. Reversible resistive switching and multilevel recording in La 0.7 Sr 0.3 MnO 3 thin films for low cost nonvolatile memories . Nano Lett. 10 , 3828 – 3835 ( 2010 ). 20836512 

  3. Zhao L. et al. Multi-level control of conductive nano-filament evolution in HfO 2 ReRAM by pulse-train operations . Nanoscale 6 , 5698 – 702 ( 2014 ). 24769626 

  4. Jo Y. et al. Multi-valued resistive switching characteristics in WO x /AlO y heterojunction resistive switching memories . J. Korean Phys. Soc. 64 , L173 – L176 ( 2014 ). 

  5. Nagashima K. et al. Resistive switching multistate nonvolatile memory effects in a single cobalt oxide nanowire . Nano lett. 10 , 1359 – 1363 ( 2010 ). 20225833 

  6. Sawa A. Resistive switching in transition metal oxides . Mater. Today 11 , 28 – 36 ( 2008 ). 

  7. Hickmott T. W. Low-frequency negative resistance in thin anodic oxide films . J. Appl. Phys. 33 , 2669 – 2682 ( 1962 ). 

  8. Lee S. B. et al. Scaling behaviors of reset voltages and currents in unipolar resistance switching . Appl. Phys. Lett. 93 , 212105 ( 2008 ). 

  9. Chen J. et al. Dynamic evolution of conducting nanofilament in resistive switching memories . Nano Lett. 13 , 3671 – 3677 ( 2013 ). 23855543 

  10. Kim K. M. et al. Collective motion of conducting filaments in Pt/n-Type TiO 2 /p-Type NiO/Pt stacked resistance switching memory . Adv. Funct. Mater. 21 , 1587 – 1592 ( 2011 ). 

  11. Chang S. H. et al. Occurrence of both unipolar memory and threshold resistance switching in a NiO film . Phys. Rev. Lett. 102 , 026801 ( 2009 ). 19257301 

  12. Jung K. et al. Unipolar resistive switching in insulating niobium oxide film and probing electroforming induced metallic components . J. Appl. Phys. 109 , 054511 ( 2011 ). 

  13. Jung K. et al. Resistance switching characteristics in Li-doped NiO . J. Appl. Phys. 103 , 034504 ( 2008 ). 

  14. Janousch M. et al. Role of oxygen vacancies in Cr-doped SrTiO 3 for resistance-change memory . Adv. Mater. 19 , 2232 – 2235 ( 2007 ). 

  15. Park J. et al. Electrode dependence of bipolar resistive switching in SrZrO 3 :Cr perovskite film-based memory devices. Electrochem . Solid-State Lett. 11 , H226 – H229 ( 2008 ). 

  16. Asamitsu A. et al. Current switching of resistive states in magnetoresistive manganites . Nature 388 , 50 – 52 ( 1997 ). 

  17. Choi J. et al. Bipolar resistance switching characteristics in a thin Ti–Ni–O compound film . Nanotechnology 20 , 175704 ( 2009 ). 19420599 

  18. Jo Y. et al. Tailoring resistive switching characteristics in WO x films using different metal electrodes . Curr. Appl. Phys. 14 , S93 – S97 ( 2014 ). 

  19. Shibuya K. et al. Impact of defect distribution on resistive switching characteristics of Sr 2 TiO 4 thin films . Adv. Mater. 22 , 411 – 414 ( 2010 ). 20217730 

  20. Kwak J. S. et al. Roles of interfacial TiO x N 1−x layer and TiN electrode on bipolar resistive switching in TiN/TiO 2 /TiN frameworks . Appl. Phys. Lett. 96 , 223502 ( 2010 ). 

  21. Bae Y. C. et al. Oxygen ion drift-induced complementary resistive switching in homo TiO x /TiO y /TiO x and hetero TiO x /TiON/TiO x triple multilayer frameworks . Adv. Funct. Mater. 22 , 709 – 716 ( 2012 ). 

  22. Tang M. H. et al. Bipolar and unipolar resistive switching behaviors of sol–gel-derived SrTiO 3 thin films with different compliance currents . Semicond. Sci. Technol. 26 , 075019 ( 2011 ). 

  23. Sun X. et al. Coexistence of the bipolar and unipolar resistive switching behaviours in Au/SrTiO 3 /Pt cells . J. Phys. D: Appl. Phys. 44 , 125404 ( 2011 ). 

  24. Yang J. J. et al. Diffusion of adhesion layer metals controls nanoscale memristive switching . Adv. Mater. 22 , 4034 – 4038 ( 2010 ). 20677188 

  25. Shuai Y. et al. Key concepts behind forming-free resistive switching incorporated with rectifying transport properties . Sci. Rep. 3 , 02208 ( 2013 ). 

  26. Jung K. et al. Temperature dependence of high- and low-resistance bistable states in polycrystalline NiO films . Appl. Phys. Lett. 90 , 052104 ( 2007 ). 

  27. Jung K. et al. Electrically induced conducting nanochannels in an amorphous resistive switching niobium oxide film . Appl. Phys. Lett. 97 , 233509 ( 2010 ). 

  28. Rossel C. et al. Electrical current distribution across a metal-insulator-metal structure during bistable switching . J. Appl. Phys. 90 , 2892 – 2898 ( 2001 ). 

  29. Yoon J. H. et al. Highly uniform, electroforming-free, and self-rectifying resistive memory in the Pt/Ta 2 O 5 /HfO 2-x /TiN structure . Adv. Funct. Mater. 24 , 5086 – 5095 ( 2014 ). 

  30. Park K. H. et al. Microstructures and interdiffusions of Pt/Ti electrodes with respect to annealing in the oxygen ambient . J. Mater. Res. 10 , 1790 – 1794 ( 1995 ). 

  31. Goux L. et al. Role of Ti out-diffusion from a Pt/Ti bi-layer on the crystalline growth of (Ba,Sr)TiO 3 : A transmission electron microscopy investigation . Thin Solid Films 515 , 1260 – 1265 ( 2006 ). 

  32. Beck A. et al. Reproducible switching effect in thin oxide films for memory applications . Appl. Phys. Lett. 77 , 139 – 141 ( 2000 ). 

  33. Do Y. H. et al. Nonvolatile unipolar and bipolar resistive switching characteristics in Co-doped TiO 2 thin films with different compliance currents . J. Korean Phys. Soc. 55 , 1009 – 1012 ( 2009 ). 

LOADING...

관련 콘텐츠

오픈액세스(OA) 유형

GOLD

오픈액세스 학술지에 출판된 논문

저작권 관리 안내
섹션별 컨텐츠 바로가기

AI-Helper ※ AI-Helper는 오픈소스 모델을 사용합니다.

AI-Helper 아이콘
AI-Helper
안녕하세요, AI-Helper입니다. 좌측 "선택된 텍스트"에서 텍스트를 선택하여 요약, 번역, 용어설명을 실행하세요.
※ AI-Helper는 부적절한 답변을 할 수 있습니다.

선택된 텍스트

맨위로