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NTIS 바로가기The Scientific World Journal, v.2015, 2015년, pp.729165 -
Begam, V. M. Thoulath (Department of ICE, Anna University, Chennai 600 025, India) , Baulkani, S. (Department of ECE, Government College of Engineering, Tirunelveli 627 002, India)
In test mode test patterns are applied in random fashion to the circuit under circuit. This increases switching transition between the consecutive test patterns and thereby increases dynamic power dissipation. The proposed ring counter based ATPG reduces vertical switching transitions by inserting t...
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