최소 단어 이상 선택하여야 합니다.
최대 10 단어까지만 선택 가능합니다.
다음과 같은 기능을 한번의 로그인으로 사용 할 수 있습니다.
NTIS 바로가기IEEE transactions on computers, v.66 no.4, 2017년, pp.616 - 630
Jeong, Jaeyong , Song, Youngsun , Hahn, Sangwook Shane , Lee, Sungjin , Kim, Jihong
The decreasing lifetime of NAND flash memory, as a side effect of recent advanced semiconductor process scaling, is emerging as one of major barriers to the wide adoption of SSDs in high-performance computing systems. In this paper, we propose Dynamic Erase Voltage and Time Scaling (DeVTS), an integ...
Proc Flash Memory Summit JEDEC SSD Endurance Workloads cox 2011 6
Stress-Test-Driven Qualification of Integrated Circuits 2011
Chulbum Kim, Jinho Ryu, Taesung Lee, Hyunggon Kim, Jaewoo Lim, Jaeyong Jeong, Seonghwan Seo, Hongsoo Jeon, Bokeun Kim, Inyoul Lee, Dooseop Lee, Pansuk Kwak, Seongsoon Cho, Yongsik Yim, Changhyun Cho, Woopyo Jeong, Kwangil Park, Jin-Man Han, Duheon Song, Kyehyun Kyung, Young-Ho Lim, Young-Hyun Jun. A 21 nm High Performance 64 Gb MLC NAND Flash Memory With 400 MB/s Asynchronous Toggle DDR Interface. IEEE journal of solid-state circuits, vol.47, no.4, 981-989.
Suh, Kang-Deog, Suh, Byung-Hoon, Lim, Young-Ho, Kim, Jin-Ki, Choi, Young-Joon, Koh, Yong-Nam, Lee, Sung-Soo, Kwon, Suk-Chon, Choi, Byung-Soon, Yum, Jin-Sun, Choi, Jung-Hyuk, Kim, Jang-Rae, Lim, Hyung-Kyu. A 3.3 V 32 Mb NAND flash memory with incremental step pulse programming scheme. IEEE journal of solid-state circuits, vol.30, no.11, 1149-1156.
Flash Memory Summit Data integrity on 20 nm SSDs frickey 2012
Hsieh, Jen-Wei, Kuo, Tei-Wei, Chang, Li-Pin. Efficient identification of hot data for flash memory storage systems. ACM transactions on storage, vol.2, no.1, 22-40.
Narayanan, Dushyanth, Donnelly, Austin, Rowstron, Antony. Write off-loading : Practical power management for enterprise storage. ACM transactions on storage, vol.4, no.3, 1-23.
Chien, Andrew A., Karamcheti, Vijay. Moore's Law: The First Ending and a New Beginning. Computer, vol.46, no.12, 48-53.
Nonvolatile Memory Technologies With Emphasis on Flash brewer 2008
Seoul Nat Univ Seoul South Korea Tech Rep Dynamic program and erase scaling in NAND flash-based storage systems jeong 2014 1
Schuegraf, K.F., Hu, Chenming. Effects of temperature and defects on breakdown lifetime of thin SiO2 at very low voltages. IEEE transactions on electron devices, vol.41, no.7, 1227-1232.
Proc Flash Memory Summit Improving NAND flash memory reliability with SSD controllers cho 0 8
Proc USENIX Conf Annu Tech Conf Janus: Optimal flash provisioning for cloud storage workloads albrecht 0 91
Proc USENIX Conf File Storage Technol Lifetime improvement of NAND flash-based storage systems using dynamic program and erase scaling jeong 0 61
Proc 10th USENIX Conf File Storage Technol Optimizing NAND flash-based SSDs via retention relaxation liu 0 11
Junghee Lee, Youngjae Kim, Shipman, G. M., Oral, S., Jongman Kim. Preemptible I/O Scheduling of Garbage Collection for Solid State Drives. IEEE transactions on computer-aided design of integrated circuits and systems : a publication of the IEEE Circuits and Systems Society, vol.32, no.2, 247-260.
BANG, Kwanhu, IM, Kyung-Il, KIM, Dong-gun, PARK, Sang-Hoon, CHUNG, Eui-Young. Power Failure Protection Scheme for Reliable High-Performance Solid State Disks. IEICE transactions on information and systems, vol.96e.d, no.5, 1078-1085.
Proc 51st Annu Des Autom Conf Retention trimming for wear reduction of flash memory storage systems shi 0 1
*원문 PDF 파일 및 링크정보가 존재하지 않을 경우 KISTI DDS 시스템에서 제공하는 원문복사서비스를 사용할 수 있습니다.
※ AI-Helper는 부적절한 답변을 할 수 있습니다.