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International journal of mass spectrometry, v.428, 2018년, pp.43 - 48
Zheng, Ying (College of Instrumentation & Electrical Engineering, Jilin University, Changchun 130021, China) , Tian, Di (College of Instrumentation & Electrical Engineering, Jilin University, Changchun 130021, China) , Liu, Ke (College of Instrumentation & Electrical Engineering, Jilin University, Changchun 130021, China) , Bao, Zemin (SHRIMP Center, Institute of Geology Chinese Academy of Geological Sciences, Beijing 100037, China) , Wang, Peizhi (SHRIMP Center, Institute of Geology Chinese Academy of Geological Sciences, Beijing 100037, China) , Qiu, Chunling (College of Instrumentation & Electrical Engineering, Jilin University, Changchun 130021, China) , Liu, Dunyi (SHRIMP Center, Institute of Geology Chinese Academy of Geological Sciences, Beijing 100037, China) , Fan, Runlong (SHRIMP Center, Institute of Geology Chinese Academy of Geological Sciences, Beijing 100037, China)
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Abstract Curve fitting is the most utilized technique to measure peak areas in time of flight secondary ion mass spectrometry (TOF-SIMS) spectra. Reliable estimations of peak parameters should be provided. However, there is not currently a reliable method to estimate the half-width of spectral peak...
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