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NTIS 바로가기Microelectronics reliability, v.88/90, 2018년, pp.1201 - 1205
Shu, Ji (College of Electrical Engineering and Information Technology, Sichuan University, Chengdu, China) , Wang, Shunliang (College of Electrical Engineering and Information Technology, Sichuan University, Chengdu, China) , Liu, Tianqi (College of Electrical Engineering and Information Technology, Sichuan University, Chengdu, China) , Jiao, Ning (College of Electrical Engineering and Information Technology, Sichuan University, Chengdu, China) , Wang, Yanbo (Department of Energy Technology, Aalborg University, Aalborg, Denmark)
Abstract Reliability and security are essential concerns in DC power system. However, due to the limited capacity of DC circuit breaker (DCCB), the rapidly growing fault current cannot be reliably interrupted. Thus the reliability of the DC power system cannot be guaranteed. In this paper, a novel ...
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