고상결정화(SPC)로 제작된 다결정 박막의 전기적 특성 변화를 측정함으로서 다결정 박막 트랜지스터(poly-Si TFT's)에 대한 온도 변화 (25~1$25^{\circ}C$)의 영향을 연구하였다. 채널 길이가 각각 1.5, 10 $\mu\textrm{m}$인 SPC로 제작된 n-채널 poly-Si TFT는 온도 변화에도 불구하고 높은 전계 효과 이동도 ($\mu$$_{FE}$ : 1.5와 10$\mu\textrm{m}$에서 각각 $\geq$82 and $\geq$60$\textrm{cm}^2$/V-s), 낮은 문턱전압 (V$_{th}$ : 1.5 와 10$\mu\textrm{m}$에서 각각 $\leq$ 1.52 and $\leq$ 2.75V), 낮은 Subthreshold swing (S$_{t}$), 그리고 양호한 ON-OFF 특성이 나타났다. 따라서, SPC로 제작된 poly-Si TFT는 액정표시장치의 주변회로에 적용할 수 있다.
고상결정화(SPC)로 제작된 다결정 박막의 전기적 특성 변화를 측정함으로서 다결정 박막 트랜지스터(poly-Si TFT's)에 대한 온도 변화 (25~1$25^{\circ}C$)의 영향을 연구하였다. 채널 길이가 각각 1.5, 10 $\mu\textrm{m}$인 SPC로 제작된 n-채널 poly-Si TFT는 온도 변화에도 불구하고 높은 전계 효과 이동도 ($\mu$$_{FE}$ : 1.5와 10$\mu\textrm{m}$에서 각각 $\geq$82 and $\geq$60$\textrm{cm}^2$/V-s), 낮은 문턱전압 (V$_{th}$ : 1.5 와 10$\mu\textrm{m}$에서 각각 $\leq$ 1.52 and $\leq$ 2.75V), 낮은 Subthreshold swing (S$_{t}$), 그리고 양호한 ON-OFF 특성이 나타났다. 따라서, SPC로 제작된 poly-Si TFT는 액정표시장치의 주변회로에 적용할 수 있다.
The influence of temperature variation (25~125$^{\circ}C$) on poly-Si thin-film transistors (TFT's) was investigated by examining the electrical properties change of poly-Si films formed by solid phase crystallization (SPC). The n-channel poly-Si TFT's fabricated by SPC with channe...
The influence of temperature variation (25~125$^{\circ}C$) on poly-Si thin-film transistors (TFT's) was investigated by examining the electrical properties change of poly-Si films formed by solid phase crystallization (SPC). The n-channel poly-Si TFT's fabricated by SPC with channel length of 1.5 and loon ,respectively, exhibit good characteristics with a high ${\mu}$$_<$TEX>FE/ ($\geq$82 and $\geq$60$\textrm{cm}^2$/V-s in 1.5 and 10$\mu\textrm{m}$, respectively), low V$_<$TEX>t/, ($\leq$1.52 and $\leq$ 2.75V in 1.5 and 10$\mu\textrm{m}$, respectively), low S$_<$TEX>t/, and good ON-OFF characteristics in spite of temperature variation. Thus, poly-Si films formed by SPC can be applied for the application to poly-Si TFT liquid crystal display with peripheral integrated circuits.
The influence of temperature variation (25~125$^{\circ}C$) on poly-Si thin-film transistors (TFT's) was investigated by examining the electrical properties change of poly-Si films formed by solid phase crystallization (SPC). The n-channel poly-Si TFT's fabricated by SPC with channel length of 1.5 and loon ,respectively, exhibit good characteristics with a high ${\mu}$$_<$TEX>FE/ ($\geq$82 and $\geq$60$\textrm{cm}^2$/V-s in 1.5 and 10$\mu\textrm{m}$, respectively), low V$_<$TEX>t/, ($\leq$1.52 and $\leq$ 2.75V in 1.5 and 10$\mu\textrm{m}$, respectively), low S$_<$TEX>t/, and good ON-OFF characteristics in spite of temperature variation. Thus, poly-Si films formed by SPC can be applied for the application to poly-Si TFT liquid crystal display with peripheral integrated circuits.
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