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[미국특허] Semiconductor package 원문보기

IPC분류정보
국가/구분 United States(US) Patent 등록
국제특허분류(IPC7판)
  • H05H-007/20
출원번호 US-0332912 (1989-04-04)
발명자 / 주소
  • Butt Sheldon H. (Godfrey IL)
출원인 / 주소
  • Olin Corporation (New Haven CT 02)
인용정보 피인용 횟수 : 91  인용 특허 : 16

초록

A semiconductor package for mounting a chip is disclosed. The package includes a first metal or metal alloy component having a first thin refractory oxide layer on a first surface. The chip is bonded to the first component. A skirt extends from the first component for strengthening the first compone

대표청구항

A semiconductor package for mounting a chip comprising: a substrate member having inner and outer surfaces with sides disposed therebetween, said inner surface adapted for mounting the chip thereon; a lead frame disposed adjacent to at least one side of said substrate, said lead frame comprised of i

이 특허에 인용된 특허 (16) 인용/피인용 타임라인 분석

  1. Butt Sheldon H. (Godfrey IL), Casing for an electrical component having improved strength and heat transfer characteristics.
  2. Andrews Daniel M. (San Marcos CA) Merlina Joseph F. (Harrisburg PA) Redmond John P. (Mechanicsburg PA) Scheingold William S. (Palmyra PA) Ulbrich George (Harrisburg PA), Chip carrier.
  3. Morris ; Sr. James B. (San Jose CA), Combined semiconductor device and printed circuit board assembly.
  4. Butt Sheldon H. (Godfrey IL), Composites of glass-ceramic to metal seals and method of making the same.
  5. Burgyan ; Stephan J., Composites of glass-ceramic-to-metal, seals and method of making same.
  6. Spinelli, Thomas S.; Manns, William G.; Weirauch, Donald F., Electronic circuit interconnection system.
  7. Sherman Charles J. (Westminster CO), Electronic device packaging arrangement.
  8. Popplewell James M. (Guilford CT), Glass or ceramic-to-metal composites or seals involving iron base alloys.
  9. Hascoe ; Norman, Hermetically sealed container for semiconductor and other electronic device s.
  10. Cossutta ; Giuseppe ; Cellai ; Marino, Molded body incorporating heat dissipator.
  11. Barnes Norman S. (Whitesboro NY) Mogle Rodman A. (Clinton NY), Molybdenum substrate thick film circuit.
  12. Takami Akio (Nagoya JPX) Kondo Kazuo (Nagoya JPX) Tanaka Kazutoshi (Nagoya JPX), Seal structure of ceramics and low expansion metallic material.
  13. Hutchison Robert V. (Oceanside CA), Semiconductor device package having lead frame structure with integral spring contacts.
  14. Narita Kazutoyo (Hitachi JA) Sakaue Tadashi (Hitachi JA) Niino Yuzi (Hitachi JA), Semiconductor device with composite metal heat-radiating plate onto which semiconductor element is soldered.
  15. Schneider Stanley (Newport Beach CA), Solid state relay having U-shaped conductive heat sink frame.
  16. Lifshin, Eric; Cargioli, Joseph D.; Schroder, Stephen J.; Wong, Joe, Transfer lamination of copper thin sheets and films, method and product.

이 특허를 인용한 특허 (91) 인용/피인용 타임라인 분석

  1. Rathburn, James, Area array semiconductor device package interconnect structure with optional package-to-package or flexible circuit to package connection.
  2. Rathburn, James, Bumped semiconductor wafer or die level electrical interconnect.
  3. Rathburn, James, Compliant conductive nano-particle electrical interconnect.
  4. Rathburn, James, Compliant conductive nano-particle electrical interconnect.
  5. Rathburn, James, Compliant core peripheral lead semiconductor socket.
  6. Rathburn, James, Compliant core peripheral lead semiconductor test socket.
  7. Rathburn, James, Compliant printed circuit area array semiconductor device package.
  8. Rathburn, James, Compliant printed circuit semiconductor package.
  9. Rathburn, James, Compliant printed circuit semiconductor package.
  10. Rathburn, James, Compliant printed circuit semiconductor tester interface.
  11. Rathburn, James, Compliant printed circuit socket diagnostic tool.
  12. Rathburn, James, Compliant printed circuit wafer level semiconductor package.
  13. Rathburn, James, Compliant printed circuit wafer probe diagnostic tool.
  14. Rathburn, James, Compliant printed flexible circuit.
  15. Rathburn, James, Compliant wafer level probe assembly.
  16. Rathburn, James, Composite polymer-metal electrical contacts.
  17. Akram, Salman, Copper interconnect.
  18. Akram,Salman, Copper interconnect.
  19. Akram,Salman, Copper interconnect.
  20. Akram,Salman, Copper interconnect for semiconductor device.
  21. Rathburn, James, Copper pillar full metal via electrical circuit structure.
  22. Rathburn, Jim, Copper pillar full metal via electrical circuit structure.
  23. Rathburn, James, Direct metalization of electrical circuit structures.
  24. Hoffman Paul R. ; Popplewell James M. ; Braden Jeffrey S., Edge connectable metal package.
  25. Rathburn, James, Electrical connector insulator housing.
  26. Rathburn, James, Electrical interconnect IC device socket.
  27. Rathburn, James, Electrical interconnect IC device socket.
  28. Temple Victor A. K., Flat power pack.
  29. Smith,Brian; Deju,Hector; Burri,Scott; Crider,Larry E.; Kreuzpaintner,Joseph; Jandzio,Gregory M.; Whybrew,Walter M., Flexible appliance and related method for orthogonal, non-planar interconnections.
  30. Ferguson, John Thomas, Focused LED headlamp with iris assembly.
  31. Rathburn, James, Fusion bonded liquid crystal polymer circuit structure.
  32. Xie,Hong; Frutschy,Kristopher; Banerjee,Koushik; Sathe,Ajit, Heat spreader and stiffener having a stiffener extension.
  33. Stephen Nicholas Siu, Heatsink retainer.
  34. Farnworth Warren M. ; Akram Salman ; Wood Alan G., Hermetic chip and method of manufacture.
  35. Farnworth Warren M. ; Akram Salman ; Wood Alan G., Hermetic chip and method of manufacture.
  36. Farnworth Warren M. ; Akram Salman ; Wood Alan G., Hermetic chip and method of manufacture.
  37. Farnworth, Warren M.; Akram, Salman; Wood, Alan G., Hermetic chip and method of manufacture.
  38. Farnworth, Warren M.; Akram, Salman; Wood, Alan G., Hermetic chip and method of manufacture.
  39. Farnworth, Warren M.; Akram, Salman; Wood, Alan G., Hermetic chip in wafer form.
  40. Farnworth Warren M., Hermetically sealed chip scale packages formed by wafer level fabrication and assembly.
  41. Rathburn, James, High performance electrical circuit structure.
  42. Rathburn, James, High performance surface mount electrical interconnect.
  43. Rathburn, James, High performance surface mount electrical interconnect.
  44. Rathburn, James, High performance surface mount electrical interconnect.
  45. Rathburn, James, High performance surface mount electrical interconnect with external biased normal force loading.
  46. Rathburn, James, High speed circuit assembly with integral terminal and mating bias loading electrical connector assembly.
  47. Rathburn, James, Hybrid printed circuit assembly with low density main core and embedded high density circuit regions.
  48. Rathburn, James J., Low profile electrical interconnect with fusion bonded contact retention and solder wick reduction.
  49. Beane Alan F. (Gilford NH) Beane Glenn L. (Plymouth NH), Manufacturing particles and articles having engineered properties.
  50. Beane Alan F. ; Beane Glenn L., Manufacturing particles and articles having engineered properties.
  51. Beane Alan F. ; Beane Glenn L., Manufacturing particles and articles having engineered properties.
  52. Rathburn, James J., Mechanical contact retention within an electrical connector.
  53. Guzek, John; Wood, Dustin, Metal core integrated circuit package with electrically isolated regions and associated methods.
  54. Tsukaguchi, Nobuyoshi; Kimura, Masami, Metal/ceramic circuit board.
  55. Rathburn, James, Metalized pad to electrical contact interface.
  56. Akram, Salman, Method and semiconductor device having copper interconnect for bonding.
  57. Tower Steven A. ; Mravic Brian, Method for making a ceramic to metal hermetic seal.
  58. Rathburn, James, Method of forming a semiconductor socket.
  59. Akram, Salman, Method of improving copper interconnects of semiconductor devices for bonding.
  60. Akram, Salman, Method of improving copper interconnects of semiconductor devices for bonding.
  61. Akram,Salman, Method of improving copper interconnects of semiconductor devices for bonding.
  62. Rathburn, James, Method of making a compliant printed circuit peripheral lead semiconductor package.
  63. Rathburn, James, Method of making a compliant printed circuit peripheral lead semiconductor test socket.
  64. Rathburn, James J., Method of making an electrical connector having electrodeposited terminals.
  65. Rathburn, Jim, Method of making an electronic interconnect.
  66. Tandy,William D.; Street,Bret K., Methods for marking a bare semiconductor die including applying a tape having energy-markable properties.
  67. Tandy,William D.; Street,Bret K., Methods for marking a packaged semiconductor die including applying tape and subsequently marking the tape.
  68. Farnworth, Warren M., Methods of wafer level fabrication and assembly of chip scale packages.
  69. Farnworth, Warren M., Methods of wafer level fabrication and assembly of chip scale packages.
  70. Tower Steven A. ; Mravic Brian, Optical component package with a hermetic seal.
  71. Harris James M. (Rte. 4 ; Box 240 Terrell TX 75160) Kiba Brigitte U. (3801 E. 14th St. #401 Plano TX 75074) Click ; Jr. Porter B. (612 Mt. Vernon Pl. Garland TX 75043), Package for a high frequency semiconductor device and methods for fabricating and connecting the same to an external cir.
  72. Frutschy,Kristopher; Chung,Chee Yee; Sankman,Bob, Package stiffener.
  73. Rathburn, James, Performance enhanced semiconductor socket.
  74. Silverman, Lawrence H., Pocket mounted chip having microstrip line.
  75. Rathburn, James, Resilient conductive electrical interconnect.
  76. Rathburn, James, Selective metalization of electrical connector or socket housing.
  77. Rathburn, Jim, Selective metalization of electrical connector or socket housing.
  78. Akram, Salman, Semiconductor device having copper interconnect for bonding.
  79. Rathburn, James, Semiconductor device package adapter.
  80. Rathburn, James, Semiconductor die terminal.
  81. Rathburn, James, Semiconductor socket with direct selective metalization.
  82. Rathburn, James, Simulated wirebond semiconductor package.
  83. Rathburn, James, Singulated semiconductor device separable electrical interconnect.
  84. Farnworth, Warren M., Stereolithographic methods for fabricating hermetic semiconductor device packages and semiconductor devices including stereolithographically fabricated hermetic packages.
  85. Farnworth, Warren M., Stereolithographic methods for fabricating hermetic semiconductor device packages and semiconductor devices including stereolithographically fabricated hermetic packages.
  86. Farnworth, Warren M., Stereolithographic methods for fabricating hermetic semiconductor device packages and semiconductor devices including stereolithographically fabricated hermetic packages.
  87. Weingand Christopher Dirk (23 A Holton St. Woburn MA 01801-5232), Surface mount package with heat transfer feature.
  88. Connell, Michael E.; Jiang, Tongbi, Wafer back side coating to balance stress from passivation layer on front of wafer and be used as die attach adhesive.
  89. Connell,Michael E.; Jiang,Tongbi, Wafer back side coating to balance stress from passivation layer on front of wafer and be used as die attach adhesive.
  90. Farnworth Warren M., Wafer level fabrication and assembly of chip scale packages.
  91. Farnworth Warren M., Wafer level fabrication and assembly of chip scale packages.

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