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In-situ cleaning of plasma treatment chamber 원문보기

IPC분류정보
국가/구분 United States(US) Patent 등록
국제특허분류(IPC7판)
  • C09K-013/08
출원번호 US-0279110 (1994-07-22)
우선권정보 JP-0225547 (1993-09-10)
발명자 / 주소
  • Watatani Hirofumi (Kawasaki JPX) Doki Masahiko (Kawasaki JPX) Okuda Shoji (Kasugai JPX) Nakahira Junya (Kawasaki JPX) Kikuchi Hideaki (Kawasaki JPX)
출원인 / 주소
  • Fujitsu Limited (Kanagawa JPX 03) Fujitsu VLSI Limited (Aichi JPX 03)
인용정보 피인용 횟수 : 30  인용 특허 : 7

초록

A cleaning of a plasma chamber is done by a NF3 plasma treatment (typically under 1 to 1.5 Torr). The etching rate of an oxide layer can be improved by inserting, between the NF3 plasma treatments, a low pressure (lower than 10-1 Torr) plasma treatment preferably in a plasma of oxygen, water vapor,

대표청구항

A process for in-situ cleaning of a plasma treatment chamber, said process comprising the steps of: conducting a first plasma treatment in a plasma treatment chamber with nitrogen trifluoride plasma at a first pressure, so as to remove an oxide layer previously deposited inside the plasma treatment

이 특허에 인용된 특허 (7)

  1. Hansen Keith J. (San Jose CA), Apparatus for performing in-situ etch of CVD chamber.
  2. Chang Mei (Cupertino CA), Cleaning process for removal of deposits from the susceptor of a chemical vapor deposition apparatus.
  3. Petro William G. (San Jose CA) Moghadam Farhad K. (Los Gatos CA), Method for improving stability of tungsten chemical vapor deposition.
  4. Moslehi Mehrdad M. (Dallas TX) Davis Cecil J. (Greenville TX) Jones John (Plano TX) Matthews Robert T. (Plano TX), Multi-electrode plasma processing apparatus.
  5. Tashiro Mamoru (Tokyo JPX) Urata Kazuo (Tokyo JPX) Yamazaki Shunpei (Tokyo JPX), Photo CVD apparatus, with deposition prevention in light source chamber.
  6. Chen Ching-Hwa (Milpitas CA) Arnett David (Fremont CA) Liu David (San Jose CA), Plasma cleaning method for removing residues in a plasma treatment chamber.
  7. Law Kam S. (Union City CA) Leung Cissy (Fremont CA) Tang Ching C. (San Francisco CA) Collins Kenneth S. (San Jose CA) Chang Mei (Cupertino CA) Wong Jerry Y. K. (Union City CA) Wang David Nin-Kou (Cup, Reactor chamber self-cleaning process.

이 특허를 인용한 특허 (30)

  1. Chandran, Shankar W.; Hendrickson, Scott; Jones, Gwendolyn D.; Venkataraman, Shankar; Yieh, Ellie, Accelerated plasma clean.
  2. Chandran,Shankar N.; Hendrickson,Scott; Jones,Gwendolyn D.; Venkataraman,Shankar; Yieh,Ellie, Accelerated plasma clean.
  3. Shankar N. Chandran ; Scott Hendrickson ; Gwendolyn D. Jones ; Shankar Venkataraman ; Ellie Yieh, Accelerated plasma clean.
  4. Ui Akio,JPX ; Kaji Naruhiko,JPX ; Miyajima Hideshi,JPX ; Hayasaka Nobuo,JPX, CVD apparatus with high throughput and cleaning method therefor.
  5. Cui, Zhenjiang; Cox, Michael S.; Lai, Canfeng; Krishnaraj, Paddy, Chamber clean method using remote and in situ plasma cleaning systems.
  6. Kikuchi Jun,JPX ; Fujimura Shuzo,JPX, Cleaning of hydrogen plasma down-stream apparatus.
  7. Dimeo, Frank; Dietz, James; Olander, W. Karl; Kaim, Robert; Bishop, Steven; Neuner, Jeffrey W.; Arno, Jose; Marganski, Paul J.; Sweeney, Joseph D.; Eldridge, David; Yedave, Sharad; Byl, Oleg; Stauf, Gregory T., Cleaning of semiconductor processing systems.
  8. Goto, Haruhiro Harry; Harshbarger, William R.; Shang, Quanyuan; Law, Kam S., Fluorine process for cleaning semiconductor process chamber.
  9. Singh, Harmeet; Daugherty, John E.; Vahedi, Vahid; Ullal, Saurabh J., In-situ cleaning of a polymer coated plasma processing chamber.
  10. Sweeney, Joseph D.; Yedave, Sharad N.; Byl, Oleg; Kaim, Robert; Eldridge, David; Feng, Lin; Bishop, Steven E.; Olander, W. Karl; Tang, Ying, Ion source cleaning in semiconductor processing systems.
  11. Banks,Peter Michael, Ion sources.
  12. Mayer, Bruce E.; Chatham, III, Robert H.; Ingle, Nitin K.; Yuan, Zheng, Method and system for in-situ cleaning of semiconductor manufacturing equipment using combination chemistries.
  13. Chen,Sheng Wen; Jangjian,Shiu Ko; Chang,Hung Jui; Wang,Ying Lang, Method for cleaning a plasma enhanced CVD chamber.
  14. Cheng, Yi-Lung; Tsan, Chun-Ching; Cheng, Wen-Kung; Wang, Yin-Lang, Method for improved cleaning in HDP-CVD process with reduced NF3 usage.
  15. Graf Michael A. ; Benveniste Victor M., Method for in-process cleaning of an ion source.
  16. Gealy F. Daniel ; Al-Shareef Husam N. ; DeBoer Scott Jeffrey, Method of processing internal surfaces of a chemical vapor deposition reactor.
  17. Gealy, F. Daniel; Al-Shareef, Husam N.; DeBoer, Scott Jeffrey, Method of processing internal surfaces of a chemical vapor deposition reactor.
  18. DiMeo, Jr., Frank; Dietz, James; Olander, W. Karl; Kaim, Robert; Bishop, Steven E.; Neuner, Jeffrey W.; Arno, Jose I., Methods for cleaning ion implanter components.
  19. Kimball, Chris; Stevenson, Tom; Muraoka, Peter, Methods for stabilizing contact surfaces of electrostatic chucks.
  20. Shang, Quanyuan; Yadav, Sanjay; Harshbarger, William R.; Law, Kam S., On-site cleaning gas generation for process chamber cleaning.
  21. Shang,Quanyuan; Yadav,Sanjay; Harshbarger,William R.; Law,Kam S., On-site cleaning gas generation for process chamber cleaning.
  22. Richardson,Brett C.; Wong,Vincent, Plasma cleaning of deposition chamber residues using duo-step wafer-less auto clean method.
  23. Iku Shiota JP; Shoichi Abe JP, Processing method for object to be processed including a pre-coating step to seal fluorine.
  24. Losavio Aldo,ITX, Recovery of damages in a field oxide caused by high energy ion implant process.
  25. Hua, Zhong Qiang; Kamath, Sanjay; Lee, Young S.; Yieh, Ellie Y.; Le, Hien-Minh Huu; Patel, Anjana M.; Gondhalekar, Sudhir R., Remote plasma clean process with cycled high and low pressure clean steps.
  26. Haruhiro Harry Goto ; William R. Harshbarger ; Kam S. Law, Selectively etching silicon using fluorine without plasma.
  27. Matsunaga Daisuke,JPX ; Hashimi Kazuo,JPX ; Komuro Genichi,JPX, Successive dry etching of alternating laminate.
  28. Fujimura,Shuzo; Takamatsu,Toshiyuki, Surface treatment method and equipment.
  29. Hasebe, Kazuhide; Okada, Mitsuhiro; Kotsugai, Hiromichi, Thin film forming apparatus and method of cleaning the same.
  30. Shrotriya Ashish V., Two step process for cleaning a substrate processing chamber.
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