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Wafer transfer system and method of using the same 원문보기

IPC분류정보
국가/구분 United States(US) Patent 등록
국제특허분류(IPC7판)
  • C23F-001/08
출원번호 US-0889172 (1997-07-08)
발명자 / 주소
  • Toshima Masato
출원인 / 주소
  • Gamma Precision Technology, Inc.
대리인 / 주소
    Lyon & Lyon LLP
인용정보 피인용 횟수 : 52  인용 특허 : 14

초록

A wafer transfer system is described for transferring a wafer while at substantially the same time another wafer is being processed. The wafer transfer system comprises, in one embodiment, a transfer chamber having a wafer transfer blade, a load lock chamber coupled to the transfer chamber, an atmos

대표청구항

[ What is claimed:] [1.] A device for processing a plurality of wafers comprising:a transfer chamber within which processing of said plurality of wafers takes place;a load lock chamber coupled to said transfer chamber;a plurality of independent temperature controlled stages located within and couple

이 특허에 인용된 특허 (14)

  1. Maeda Kazuo (Tokyo JPX) Ohira Kouichi (Tokyo JPX) Hirose Mitsuo (Tokyo JPX), Apparatus for manufacturing semiconductor device.
  2. Boys Donald R. (Cupertino CA) Graves Walter E. (San Jose CA), Dial deposition and processing apparatus.
  3. Kinoshita Haruhisa,JPX ; Matsumoto Osamu,JPX ; Sakuma Harunobu,JPX, Dry process system.
  4. Thomas Michael E. (Milpitas CA) van de Van Everhardus P. (Cupertino CA) Broadbent Eliot K. (San Jose CA), Gas-based backside protection during substrate processing.
  5. Matsudo Masahiko (Kofu JPX) Koshiishi Akira (Kofu JPX) Isozaki Kei (Oomuta JPX) Hirashima Yutaka (Oomuta JPX), Heat-resistant electrode material, electrode using the same, and apparatus having plasma generating unit using this elec.
  6. Benzing Jeffrey C. (Saratoga CA) Broadbent Eliot K. (San Jose CA) Rough J. Kirkwood H. (San Jose CA), Induction plasma source.
  7. Benzing Jeffrey C. (Saratoga CA) Broadbent Eliot K. (San Jose CA) Rough Kirkwood H. (San Jose CA), Induction plasma source.
  8. Rigali Louis A. ; Hoffman David E. ; Smith ; III William F., Methods and apparatus for plasma treatment of workpieces.
  9. Maydan Dan (Los Altos Hills CA) Somekh Sasson (Redwood City CA) Wang David N. (Cupertino CA) Cheng David (San Jose CA) Toshima Masato (San Jose CA) Harari Isaac (Mountain View CA) Hoppe Peter D. (Sun, Multichamber integrated process system.
  10. Mattson Brad S. (19251 Black Rd. Los Gatos CA 95030) Martin Ralph S. (1582 S. Wolfe Rd. Sunnyvale CA 94087), Plasma contamination removal process.
  11. Davis Cecil J. (Greenville TX) Freeman Dean W. (Garland TX) Matthews Robert T. (Plano TX) Tomlin Joel T. (Garland TX), Processing apparatus for wafers.
  12. Maher Joseph A. (South Hamilton MA) Vowles E. John (Goffstown NH) Napoli Joseph D. (Winham NH) Zafiropoulo Arthur W. (Manchester MA) Miller Mark W. (Burlington MA), Quad processor.
  13. Higashi Kumiko (Kumamoto JPX), Rotary type apparatus for processing semiconductor wafers and method of processing semiconductor wafers.
  14. Begin Robert George ; Clarke Peter J., System for providing a controlled deposition on wafers.

이 특허를 인용한 특허 (52)

  1. Trammell, Harold L., Assembly for transporting material.
  2. Blonigan, Wendell Thomas; Toshima, Masato; Law, Kam S.; Berkstresser, David Eric; Kleinke, Steve; Stevens, Craig Lyle, Auto-sequencing multi-directional inline processing method.
  3. Stevens, Craig Lyle; Berkstresser, David Eric; Blonigan, Wendell Thomas, Broken wafer recovery system.
  4. Sommer, Phillip R.; Butterfield, Paul D.; Oen, Joshua T.; Meng, Ching-Ling, Chemical mechanical planarization system.
  5. Lewington, Richard; Collard, Corey; Anderson, Scott; Nguyen, Khiem, Cluster tool with integrated metrology chamber for transparent substrates.
  6. Sugimura Shunsuke,JPX ; Nose Matsuo,JPX, Control device for a work carrying system.
  7. Lee Chunghsin, Disk furnace for thermal processing.
  8. Choul-gue Park KR, Etching apparatus for manufacturing semiconductor devices.
  9. Arnold T. M. Telkamp NL; Richard G. T. Fierkens NL, Leadframe transport and method therefor.
  10. Telkamp Arnold T. M.,NLX ; Fierkens Richard G. T.,NLX, Leadframe transport and method therefor.
  11. Trammell, Harold L.; Bond, Robert H., Material transport method.
  12. Lymberopoulos,Dimitris; Hsueh,Gary; Mohan,Sukesh, Method and apparatus employing integrated metrology for improved dielectric etch efficiency.
  13. Mui, David S L; Liu, Wei; Sasano, Hiroki, Method and apparatus for controlling etch processes during fabrication of semiconductor devices.
  14. Mui,David S L; Liu,Wei; Sasano,Hiroki, Method and apparatus for controlling etch processes during fabrication of semiconductor devices.
  15. Nguyen, Khiem K.; Lewington, Richard, Method and apparatus for integrating metrology with etch processing.
  16. Price, JB; Keller, Jed; Dulmage, Laurence; Cheng, David, Method and apparatus for semiconductor processing.
  17. Birkner, Andreas; Bernhardt, Frank; Hiltawski, Knut, Method and arrangement for transporting and inspecting semiconductor substrates.
  18. Birkner, Andreas; Bernhardt, Frank; Hiltawski, Knut, Method and arrangement for transporting and inspecting semiconductor substrates.
  19. Birkner,Andreas; Bernhardt,Frank; Hiltawski,Knut, Method and arrangement for transporting and inspecting semiconductor substrates.
  20. Lu,Chih Shiun, Method and device for dynamically accelerating analog-to-digital converter.
  21. Mui, David S. L.; Liu, Wei; Deshmukh, Shashank C.; Sasano, Hiroki, Method and system for realtime CD microloading control.
  22. Liu, Wei; Mui, David, Method of controlling critical dimension microloading of photoresist trimming process by selective sidewall polymer deposition.
  23. Al Bayati,Amir; Adibi,Babak; Foad,Majeed; Somekh,Sasson, Method, system and medium for controlling semiconductor wafer processes using critical dimension measurements.
  24. Mui, David S. L.; Sasano, Hiroki; Liu, Wei, Methodology for repeatable post etch CD in a production tool.
  25. Todaka, Ryoji, Multi-station workpiece processors, methods of processing semiconductor workpieces within multi-station workpiece processors, and methods of moving semiconductor workpieces within multi-station workpiece processors.
  26. Heyder, Roger V.; Brezocsky, Thomas B.; Davenport, Robert E., Multiple loadlock system.
  27. Gifford, Jeffrey P.; Sherwood, Edward, Pod swapping internal to tool run time.
  28. De Ridder, Christianus Gerardus Maria; den Hartog, Edwin, Processing system with increased cassette storage capacity.
  29. Cheng, Yi-Lung; Lin, Hui-Chi; Wu, Szu-An; Wang, Ying-Lang, Semiconductor chamber process apparatus and method.
  30. Fairbairn, Kevin P.; Su, Bo, Semiconductor processing module with integrated feedback/feed forward metrology.
  31. Shirai, Hidenobu, Semiconductor transfer and manufacturing apparatus.
  32. Yoshida Yasushi,JPX, Substrate feed control.
  33. Aggarwal, Ravinder; Stoutjesdijk, Jeroen, Substrate handling chamber with movable substrate carrier loading platform.
  34. Ito, Naohide; Osada, Keiji; Morisawa, Daisuke, Substrate processing apparatus.
  35. Toshima, Masato, Substrate processing apparatus.
  36. Sakaue, Hiromitsu; Horiuchi, Takashi, Substrate processing method.
  37. Sakaue, Hiromitsu; Horiuchi, Takashi, Substrate processing system and substrate processing method.
  38. Kevin K. Chan ; Christopher P. D'Emic ; Raymond M. Sicina ; Paul M. Kozlowski ; Margaret Manny ; Sandip Tiwari, UHV horizontal hot wall cluster CVD/growth design.
  39. Minoru Soraoka JP; Ken Yoshioka JP; Yoshinao Kawasaki JP, Vacuum processing apparatus and semiconductor manufacturing line using the same.
  40. Soraoka, Minoru; Yoshioka, Ken; Kawasaki, Yoshinao, Vacuum processing apparatus and semiconductor manufacturing line using the same.
  41. Soraoka, Minoru; Yoshioka, Ken; Kawasaki, Yoshinao, Vacuum processing apparatus and semiconductor manufacturing line using the same.
  42. Soraoka, Minoru; Yoshioka, Ken; Kawasaki, Yoshinao, Vacuum processing apparatus and semiconductor manufacturing line using the same.
  43. Soraoka, Minoru; Yoshioka, Ken; Kawasaki, Yoshinao, Vacuum processing apparatus and semiconductor manufacturing line using the same.
  44. Soraoka, Minoru; Yoshioka, Ken; Kawasaki, Yoshinao, Vacuum processing apparatus and semiconductor manufacturing line using the same.
  45. Soraoka, Minoru; Yoshioka, Ken; Kawasaki, Yoshinao, Vacuum processing apparatus and semiconductor manufacturing line using the same.
  46. Soraoka, Minoru; Yoshioka, Ken; Kawasaki, Yoshinao, Vacuum processing apparatus and semiconductor manufacturing line using the same.
  47. Soraoka, Minoru; Yoshioka, Ken; Kawasaki, Yoshinao, Vacuum processing apparatus and semiconductor manufacturing line using the same.
  48. Soraoka,Minoru; Yoshioka,Ken; Kawasaki,Yoshinao, Vacuum processing apparatus and semiconductor manufacturing line using the same.
  49. Soraoka,Minoru; Yoshioka,Ken; Kawasaki,Yoshinao, Vacuum processing apparatus and semiconductor manufacturing line using the same.
  50. Jim Tobin, Wafer transfer station for a chemical mechanical polisher.
  51. Tobin Jim, Wafer transfer station for a chemical mechanical polisher.
  52. Toshima Masato, Wafer transfer system.
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