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Edge handling wafer chuck 원문보기

IPC분류정보
국가/구분 United States(US) Patent 등록
국제특허분류(IPC7판)
  • B05C-013/00
  • B23B-031/18
출원번호 US-0836655 (2001-04-17)
발명자 / 주소
  • Smedt, Rodney G.
  • Coad, George
출원인 / 주소
  • KLA-Tencor Corporation
대리인 / 주소
    Smyrski & Livesay, LLP
인용정보 피인용 횟수 : 18  인용 특허 : 20

초록

An edge handling chuck which operates to maintain a semiconductor wafer at a desirable orientation while rotating the wafer at high speeds is disclosed. The edge handling chuck consists of a cylindrical plate which holds a silicon wafer using multiple spring loaded edge wafer clamps. Gas passes thro

대표청구항

An edge handling chuck which operates to maintain a semiconductor wafer at a desirable orientation while rotating the wafer at high speeds is disclosed. The edge handling chuck consists of a cylindrical plate which holds a silicon wafer using multiple spring loaded edge wafer clamps. Gas passes thro

이 특허에 인용된 특허 (20)

  1. Mears Eric L. (Rockport MA) Hertel Richard J. (Boxford MA) Brick Robert V. (Gloucester MA) Holt ; Jr. Carl J. (Newburyport MA), Apparatus for retaining wafers.
  2. Ikeda Masahide,JPX ; Ohtani Masami,JPX, Apparatus for substrate holding.
  3. Schiele Bernd (Burghausen DEX) Niedermeier Johann (Burgkirchen DEX), Apparatus for supporting crystalline wafers.
  4. Pirker Willibald,ATX, Conveying device for thin disk-like articles.
  5. Smedt Rodney G ; Coad George, Edge handling wafer chuck.
  6. Lo Allen K. (Dunwoody GA), Filmless method and apparatus for producing 3-D photographs.
  7. Murdoch Steven (Palo Alto CA), Method and apparatus for handling semiconductor wafers.
  8. Kakehi Yutaka (Hikari JPX) Kaji Ryokichi (Chiyoda JPX) Izumi Hideki (Kudamatsu JPX) Makino Toshiaki (Kudamatsu JPX) Ichihashi Kazuaki (Kudamatsu JPX) Kawashima Sosuke (Kudamatsu JPX), Sample chucking apparatus.
  9. Maydan Dan (Los Altos Hills CA) Somekh Sasson R. (Redwood City CA) Ryan-Harris Charles (La Honda CA) Seilheimer Richard A. (Pleasanton CA) Cheng David (San Jose CA) Abolnikov Edward M. (San Francisco, Semiconductor processing system with robotic autoloader and load lock.
  10. Tateyama Kiyohisa (Kumamoto JPX) Matsushita Michiaki (Yatsushiro JPX), Spin chuck and treatment apparatus using same.
  11. Hearne John S. (Los Altos CA), Spindle assembly with improved wafer holder.
  12. Sumnitsch Franz (Klagenfurt ATX), Support for slice-shaped articles and device for etching silicon wafers with such a support.
  13. Rahn ; Oskar ; Krause ; Hermann, Tool for the contact-free support of discs.
  14. Phillips Edward H. (Mountain View CA), Two-stage wafer prealignment system for an optical alignment and exposure machine.
  15. Cripe Jerry D. (Tempe AZ) Martinez ; Jr. Joe L. (Phoenix AZ), Vacuum chuck with venturi jet for converting positive pressure to a vacuum.
  16. Sinclair James ; Lee Lawrence L., Wafer carrier for chemical mechanical planarization polishing.
  17. Abbe Robert C. (Newton MA) Poduje Noel S. (Needham Heights MA) Goodall Randal K. (North Chelmsford MA) Domenicali Peter (Montpelier VT), Wafer handling and processing system.
  18. Dean Robert E. (High Bridge NJ) Fink James L. (Millburn NJ), Wafer holding apparatus and method.
  19. Shaw R. Howard (Palo Alto CA), Wafer support assembly.
  20. Halpin Michael W. ; Hawkins Mark R. ; Foster Derrick W. ; Vyne Robert M. ; Wengert John F. ; van der Jeugd Cornelius A. ; Jacobs Loren R., Wafer support system.

이 특허를 인용한 특허 (18)

  1. Glenn, Joe M.; Pridmore, Clive M.; Castner, Bryan G.; Freischlad, Klaus, Apparatus and method for holding and transporting thin opaque plates.
  2. Camm,David Malcolm; Bumbulovic,Mladen; Cibere,Joseph; Elliott,J. Kiefer; McCoy,Steve; Stuart,Greg, Apparatuses and methods for suppressing thermally-induced motion of a workpiece.
  3. Kusunose, Haruhiko, Chucking device and chucking method.
  4. Spady,Blaine R.; Blaufus,Christopher W.; Page,Douglas A.; Colban,Dan M., Edge grip chuck.
  5. Watkins,Cory; Harless,Mark; Abraham,Francy, Edge inspection.
  6. Siebert, Sönke; Drews, Dietrich; Wenz, Holger, Holding and turning device for touch-sensitive flat objects.
  7. Shankar, Premchandra M.; Varadarajan, Ashok, Method and system for detecting defects on a substrate.
  8. Cai, Zhongping; Xiong, Jingyi; Trytko, Tyler; Slobodov, Alexander; Doyle, Paul; Romanovsky, Anatoly, Method and system for simultaneous tilt and height control of a substrate surface in an inspection system.
  9. Park, Allen; Chang, Ellis; Adel, Michael; Bhaskar, Kris; Levy, Ady; Widmann, Amir; Wagner, Mark; Rong, Songnian, Method and system for universal target based inspection and metrology.
  10. Belyaev, Alexander; Wolters, Christian H.; Petrenko, Aleksey; Doyle, Paul, Method for improving edge handling chuck aerodynamics.
  11. Camm, David Malcolm; Sempere, Guillaume; Kaludjercic, Ljubomir; Stuart, Gregory; Bumbulovic, Mladen; Tran, Tim; Dets, Sergiy; Komasa, Tony; Rudolph, Marc; Cibere, Joseph, Methods and systems for supporting a workpiece and for heat-treating the workpiece.
  12. Camm, David Malcolm; Sempere, Guillaume; Kaludjercic, Ljubomir; Stuart, Gregory; Bumbulovic, Mladen; Tran, Tim; Dets, Sergiy; Komasa, Tony; Rudolph, Marc; Cibere, Joseph, Methods and systems for supporting a workpiece and for heat-treating the workpiece.
  13. Kim, Hyun Jong; Kim, Ju Won; Cho, Jung Keun, Spin head and substrate treating method using the same.
  14. Huang, Luping, System and method for non-contact wafer chucking.
  15. Camm, David Malcolm; Cibere, Joseph; Bumbulovic, Mladen, Systems and methods for supporting a workpiece during heat-treating.
  16. Camm,David M.; Kervin,Shawna; Lefrancois,Marcel Edmond; Stuart,Greg, Temperature measurement and heat-treating methods and system.
  17. Camm, David M.; Kervin, Shawna; Lefrancois, Marcel Edmond; Stuart, Greg, Temperature measurement and heat-treating methods and systems.
  18. Camm, David Malcolm; Cibere, Joseph; Stuart, Greg; McCoy, Steve, Workpiece breakage prevention method and apparatus.
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