초록 ▼

A biometrics system captures and processes a handprint image using a structured light illumination to create a 2D representation equivalent of a rolled inked handprint. The biometrics system includes an enclosure with a scan volume for placement of the hand. A reference plane with a backdrop pattern

A biometrics system captures and processes a handprint image using a structured light illumination to create a 2D representation equivalent of a rolled inked handprint. The biometrics system includes an enclosure with a scan volume for placement of the hand. A reference plane with a backdrop pattern forms one side of the scan volume. The backdrop pattern is preferably a random noise pattern and the coordinates of the backdrop pattern are predetermined at system provisioning. The biometrics system further includes at least one projection unit for projecting a structured light pattern onto a hand positioned in the scan volume on or in front of the backdrop pattern and at least two cameras for capturing a plurality of images of the hand, wherein each of the plurality of images includes at least a portion of the hand and the backdrop pattern. A processing unit calculates 3D coordinates of the hand from the plurality of images using the predetermined coordinates of the backdrop pattern to align the plurality of images and mapping the 3D coordinates to a 2D flat surface to create a 2D representation equivalent of a rolled inked handprint. The processing unit can also adjust calibration parameters for each hand scan from calculating coordinates of the portion of backdrop pattern in the at least one image and comparing with the predetermined coordinates of the backdrop pattern.

대표청구항 ▼

1. A three dimensional (3D) imaging system using a structured light illumination (SLI) technique, comprising: at least one projection unit for projecting at least one structured light pattern onto a 3D object, wherein the at least one structured light pattern includes N different component patterns,

1. A three dimensional (3D) imaging system using a structured light illumination (SLI) technique, comprising: at least one projection unit for projecting at least one structured light pattern onto a 3D object, wherein the at least one structured light pattern includes N different component patterns, wherein each of the N different component patterns is a different color;one or more cameras for capturing at least one SLI image of the 3D object with the structured light pattern projected onto the 3D object; anda processing unit for processing the at least one SLI image and separating the N different component patterns projected onto the 3D object to determine coordinates of the 3D object and wherein the processing unit is operable to process the SLI image of the 3D object to recover albedo values for a plurality of pixels of the SLI image. 2. The 3D imaging system of claim 1, wherein the projection unit projects an albedo pattern onto the 3D object and the one or more cameras capture at least one albedo image of the 3D object with the albedo pattern projected onto the 3D object. 3. The 3D imaging system of claim 2, wherein the processing unit is operable to process the albedo image of the 3D object with the projected albedo pattern to recover albedo values for a plurality of pixels of the albedo image. 4. The 3D imaging system of claim 3, wherein the processing unit is operable to align a plurality of pixels of the at least one SLI image that correspond to the plurality of pixels of the albedo image. 5. The 3D imaging system of claim 4, wherein the processing unit is operable to separate the N different component patterns in the plurality of pixels of the at least one SLI image based on the albedo values of the corresponding plurality of points of the albedo image. 6. The 3D imaging system of claim 5, wherein the processing unit is operable to determine 3D coordinates of the plurality of pixels of the at least one SLI image based on distortions of one or more of the N different component patterns of the structured light pattern. 7. The 3D imaging system of claim 6, wherein the N different component patterns includes at least two component patterns of different color. 8. The 3D imaging system of claim 2, wherein the processing unit is operable to process the SLI image to extract at least one of the N component patterns and determine albedo values for the plurality of pixels of the SLI image based on the at least one N component pattern. 9. The 3D imaging system of claim 8, wherein the processing unit is operable to process the SLI image to extract at least one other of the N component patterns and determine 3D coordinates for the plurality of pixels of the SLI image based on distortion of the at least one other N component pattern. 10. A method using a structured light illumination (SLI) technique to determine coordinates of a three dimensional (3D) object, comprising: projecting at least one structured light pattern onto a 3D object, wherein the at least one structured light pattern includes N different component patterns and each of the N different component patterns is a different color;capturing at least one SLI image of the 3D object with the structured light pattern projected onto the 3D object;processing the at least one SLI image to separate the N different component patterns projected onto the 3D object;determining coordinates of the 3D object in the SLI image; andprocessing the SLI image of the 3D object to recover albedo values for a plurality of pixels of the SLI image. 11. The method of claim 10, further comprising: projecting an albedo pattern onto the 3D object; andcapturing at least one albedo image of the 3D object with the albedo pattern projected onto the 3D object. 12. The method of claim 11, further comprising: processing the albedo image of the 3D object with the projected albedo pattern to recover albedo values for a plurality of pixels of the albedo image. 13. The method of claim 12, further comprising: aligning a plurality of pixels of the at least one SLI image that corresponds to the plurality of pixels of the albedo image. 14. The method of claim 13, wherein the N different component patterns are separated in the plurality of pixels of the at least one SLI image based on the albedo values of the corresponding plurality of points of the albedo image. 15. The method of claim 14, wherein determining coordinates of the 3D object in the SLI image includes: determining 3D coordinates of the plurality of pixels of the at least one SLI image based on distortions of one or more of the N different component patterns of the structured light pattern. 16. The method of claim 15, wherein the N different component patterns includes at least two component patterns of different color. 17. The method of claim 10, wherein processing the SLI image of the 3D object to recover albedo values includes: processing the SLI image to extract at least one of the N component patterns; anddetermining albedo values for the plurality of pixels of the SLI image based on the at least one N component pattern. 18. The method of claim 17, wherein determining coordinates of the 3D object in the SLI image includes: processing the SLI image to extract at least one other of the N component patterns; anddetermining 3D coordinates for the plurality of pixels of the SLI image based on distortions in the at least one other N component pattern.