초록 ▼

A system for detecting a magnetic flux includes: a magnetic-flux-generating coil having a first and second excitation-track elements extending essentially parallel to a reference plane; a flux-conducting structure for guiding the produced magnetic flux; and a flux-detecting coil having a first detec

A system for detecting a magnetic flux includes: a magnetic-flux-generating coil having a first and second excitation-track elements extending essentially parallel to a reference plane; a flux-conducting structure for guiding the produced magnetic flux; and a flux-detecting coil having a first detection-track element for measuring at least a portion of the produced magnetic flux, the first detection-track element extending in a first plane defined by the first and second excitation-track elements between the first and the second excitation-track elements. The projection of the excitation-track elements of the flux-generating coil onto a projection plane extending parallel to the reference plane essentially covers the projection of the flux-conducting structure onto the projection plane, at least in the region of the windings of the flux-generating coil.

대표청구항 ▼

1. A system for detecting a magnetic flux, comprising: a flux-generating coil for producing a magnetic flux, the flux-generating coil having a plurality of windings and at least one first and one second excitation-track elements in the region of the windings, the excitation-track elements extending

1. A system for detecting a magnetic flux, comprising: a flux-generating coil for producing a magnetic flux, the flux-generating coil having a plurality of windings and at least one first and one second excitation-track elements in the region of the windings, the excitation-track elements extending in a first plane; a flux-conducting structure for guiding the produced magnetic flux, wherein the first plane runs above the flux-conducting structure and parallel to a main extension direction; and a first flux-detecting coil having a first detection-track element for measuring at least one portion of the produced magnetic flux, wherein the first detection-track element extends between the first and second excitation-track elements in the first plane essentially completely cover of the flux-conducting structure, wherein at least one of the first excitation-track element and the second excitation-track element is in contact with the flux-conducting structure. 2. The system as recited in claim 1, further comprising: a second flux-detecting coil having a second detection-track element;wherein the first excitation-track element and the second excitation-track element extend parallel to each other in the first plane along a main-extension direction of the first and second excitation-track elements, and wherein the first excitation-track element and the second excitation-track element are set apart in the first plane in a direction perpendicular to the main-extension direction, and wherein the first detection-track element and the second detection-track element extend in the first plane, and wherein the first detection-track element and the second detection-track element extend between the first excitation-track element and the second excitation-track element. 3. The system as recited in claim 2, wherein the flux-generating coil has a third excitation-track element and a fourth excitation-track element extending in a second plane parallel to the first plane, and wherein the flux-conducting structure extends between the first plane and the second plane. 4. The system as recited in claim 2, wherein the first flux-detecting coil is connected in series with the second flux-detecting coil such that the output of the first flux-detecting coil is connected to the input of second flux-detecting coil. 5. The system as recited in claim 4, wherein the first flux-detecting coil is connected to the second flux-detecting coil by a connection extending outside of the region in which the windings of the flux-generating coil are situated, such that the induction currents in the first and second flux-detecting coils have the same arrangement with respect to a main-extension direction of the system. 6. The system as recited in claim 4, wherein the flux-conducting structure is configured as a magnetic thin film extending essentially parallel to the reference plane. 7. The system as recited in claim 6, further comprising a semiconductor substrate, wherein the system is a microsystem. 8. The system as recited in claim 7, wherein the flux-conducting structure in the form of a magnetic thin film is applied on the semiconductor substrate.