Piezoelectric vibration sensor for fluid leak detection
원문보기
IPC분류정보
국가/구분
United States(US) Patent
등록
국제특허분류(IPC7판)
G01M-003/24
G01H-011/08
F17D-005/06
H04R-017/00
H01L-041/08
E03B-007/00
G01L-001/18
G01N-029/04
F16L-055/28
G01M-003/00
F16L-101/30
출원번호
US-0503951
(2014-10-01)
등록번호
US-9528903
(2016-12-27)
발명자
/ 주소
Zusman, George V.
출원인 / 주소
Mueller International, LLC
대리인 / 주소
Taylor English Duma LLP
인용정보
피인용 횟수 :
0인용 특허 :
203
초록▼
A vibration sensor includes at least one piezoelectric crystal having an upper surface and a lower surface; a base having an attachment section defining an attachment surface and an at least one calibration mass; wherein a one of the at least one piezoelectric crystal upper surface and lower surface
A vibration sensor includes at least one piezoelectric crystal having an upper surface and a lower surface; a base having an attachment section defining an attachment surface and an at least one calibration mass; wherein a one of the at least one piezoelectric crystal upper surface and lower surface attaches to the attachment surface of the base; and wherein the at least one calibration mass is external to the piezoelectric crystal.
대표청구항▼
1. A sensor comprising: at least one piezoelectric crystal having an upper surface and a lower surface;a base having an attachment section defining an attachment surface, a first calibration mass, a second calibration mass, and a notch between the first calibration mass and the second calibration ma
1. A sensor comprising: at least one piezoelectric crystal having an upper surface and a lower surface;a base having an attachment section defining an attachment surface, a first calibration mass, a second calibration mass, and a notch between the first calibration mass and the second calibration mass, the first calibration mass comprising a first calibration mass thickness greater than a thickness of the attachment section of the base, and the second calibration mass comprising a second calibration mass thickness greater than the thickness of the attachment section of the base, the base further defining an axis therethrough;wherein a one of the at least one piezoelectric crystal upper surface and lower surface attaches to the attachment surface of the base; andwherein the at least one piezoelectric crystal is positioned radially inward from the first calibration mass and the second calibration mass relative to the axis of the base. 2. The sensor of claim 1, wherein the first calibration mass and the second calibration mass each define a radially innermost edge defining a radius, and the at least one piezoelectric crystal defines a radially outermost edge defining a radius, and wherein the radius of the radially outermost at least one piezoelectric crystal is less than the radius of the radially innermost edge of the first calibration mass and the second calibration mass. 3. The sensor of claim 1, wherein the first calibration mass and the second calibration mass define an outer rim of the base. 4. The sensor of claim 1, wherein the second calibration mass thickness is equal to the first calibration mass thickness. 5. The sensor of claim 1, wherein the base includes at least three calibration masses, each of the at least three calibration masses having a calibration mass thickness greater than a combined thickness of the at least one piezoelectric crystal and the attachment section. 6. The sensor of claim 1, wherein the first calibration mass is wedge-shaped and defines a rectangular cross-section. 7. The sensor of claim 1, wherein the lower surface of the piezoelectric crystal is attached to the attachment surface of the base, and wherein the first calibration mass extends above the upper surface of the at least one piezoelectric crystal. 8. The sensor of claim 1, wherein the first calibration mass thickness is greater than a combined thickness of the attachment section of the base and the at least one piezoelectric crystal. 9. The sensor of claim 1, wherein the at least one piezoelectric crystal is a first piezoelectric crystal, the vibration sensor further comprising a second piezoelectric crystal having an upper surface and lower surface, the upper surface of the second piezoelectric crystal attached to a second attachment surface of the attachment section of the base. 10. The sensor of claim 9, wherein the first calibration mass thickness is greater than a combined thickness of the attachment section, the first piezoelectric crystal, and the second piezoelectric crystal. 11. A method of manufacturing a sensor comprising: forming a base of the vibration sensor with an attachment section defining an attachment surface, a first calibration mass, a second calibration mass, and a notch between the first calibration mass and the second calibration mass, the first calibration mass comprising a first calibration mass thickness greater than a thickness of the attachment section of the base, and the second calibration mass comprising a second calibration mass thickness greater than the thickness of the attachment section of the base, the base further defining an axis therethrough; andattaching a piezoelectric crystal to the attachment surface of the attachment section of the base, the piezoelectric crystal positioned radially inward from the first calibration mass and the second calibration mass relative to the axis of the base. 12. The sensor of claim 11, wherein the first calibration mass and the second calibration mass each define a radially innermost edge defining a radius, and the piezoelectric crystal defines a radially outermost edge defining a radius, and wherein the radius of the radially outermost at least one piezoelectric crystal is less than the radius of the radially innermost edge of the first calibration mass and the second calibration mass. 13. The method of claim 11, further comprising attaching a second piezoelectric crystal to a second attachment surface of the attachment section of the base. 14. The method of claim 11, wherein the first calibration mass thickness is greater than a combined thickness of the piezoelectric crystal and the attachment section of the base. 15. A method of detecting vibrations with a sensor comprising: attaching the sensor to a piping member, the sensor including: at least one piezoelectric crystal having an upper surface and a lower surface; anda base having an attachment section defining a first calibration mass, a second calibration mass, and a notch between the first calibration mass and the second calibration mass, the first calibration mass comprising a first calibration mass thickness greater than a thickness of the attachment section of the base, and the second calibration mass comprising a second calibration mass thickness greater than the thickness of the attachment section of the base, the base further defining an axis therethrough;wherein the attachment section defines an attachment surface;wherein a one of the upper surface and the lower surface of the at least one piezoelectric crystal attaches to the attachment surface of the attachment section; andthe at least one piezoelectric crystal positioned radially inward from the first calibration mass and the second calibration mass relative to the axis of the base;monitoring a signal output of the sensor;receiving a signal output from the sensor; anddetermining that the signal indicates that a vibration has been sensed. 16. The sensor of claim 15, wherein the first calibration mass and the second calibration mass each define a radially innermost edge defining a radius, and the at least one piezoelectric crystal defines a radially-outermost edge defining a radius, and wherein the radius of the radially outermost at least one piezoelectric crystal is less than the radius of the radially innermost edge of the first calibration mass and the second calibration mass. 17. The method of claim 15, wherein receiving the signal output includes converting a vibration signal amplitude into a proportional signal for processing in a processor. 18. The method of claim 15, wherein determining that a signal indicates that a vibration has been sensed includes comparing the received signal output with a predetermined threshold level. 19. The method of claim 18, wherein the received signal output is marked as a trigger event if the received signal output surpasses the predetermined threshold level. 20. The method of claim 19, further comprising sending an alert signal to a utility provider when a trigger event is determined.
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