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An integrated circuit includes an operational circuit and a test circuit for measuring a leakage current associated with all or part of the operational circuit. The leakage current measurement circuit may include a mirror circuit configured to mirror leakage current to a current-to-voltage converter

An integrated circuit includes an operational circuit and a test circuit for measuring a leakage current associated with all or part of the operational circuit. The leakage current measurement circuit may include a mirror circuit configured to mirror leakage current to a current-to-voltage converter and an analog-to-digital converter configured to convert the analog voltage representative of the leakage current developed by the current-to-voltage converter to a digital value.

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1. A circuit for measuring a leakage current in a semiconductor integrated circuit, comprising: a system on chip (SoC), including a multi-mode self-test circuit, wherein the self-test circuit includes transistor or functional block current leakage measurement circuitry, including:an operational ampl

1. A circuit for measuring a leakage current in a semiconductor integrated circuit, comprising: a system on chip (SoC), including a multi-mode self-test circuit, wherein the self-test circuit includes transistor or functional block current leakage measurement circuitry, including:an operational amplifier configured to receive a reference voltage at a non-inverted input terminal and a feedback voltage at an inverted input terminal connected to a feedback node, and to amplify a difference between the reference voltage and the feedback voltage;a first PMOS transistor having a gate to which an output voltage of the operational amplifier is applied, a source connected to a first supply voltage, and a drain connected to the feedback node;a first switch connected between the feedback node and a circuit block to be tested;a second PMOS transistor having a gate connected to the gate of the first PMOS transistor, and a source connected to the first supply voltage;a resistor connected between a drain of the second PMOS transistor and a ground voltage; andan analog-to-digital (A/D) converter configured to perform an A/D conversion on a first voltage signal measured from the resistor to generate output data, wherein the circuit block to be tested includes a first NMOS transistor and a third PMOS transistor; andfurther comprising:a second switch connected between a source of the first NMOS transistor and the ground voltage;a third switch having a first terminal connected to a first terminal of the first switch, a second terminal connected to the ground voltage, and a third terminal connected to a gate of the first NMOS transistor;a fourth switch having a first terminal connected to the first terminal of the first switch, a second terminal connected to the ground voltage, and a third terminal connected to a drain of the first NMOS transistor;a fifth switch connected between a drain of the third PMOS transistor and the ground voltage;a sixth switch having a first terminal connected to the first terminal of the first switch, a second terminal connected to a second supply voltage, and a third terminal connected to a gate of the third PMOS transistor;a seventh switch having the first terminal connected to the first terminal of the first switch, a second terminal connected to the second supply voltage, and a third terminal connected to a source of the third PMOS transistor; and an eighth switch having a first terminal connected to the first terminal of the first switch, a second terminal connected to the second supply voltage, and a third terminal connected to a bulk of the third PMOS transistor. 2. The circuit of claim 1, wherein the reference voltage is configured to have a voltage level lower than the first supply voltage. 3. The circuit of claim 1, wherein a gate-on current (Ig_on) of an NMOS transistor is measured with the gate of the first NMOS transistor electrically connected to the feedback node, and the source and drain of the first NMOS transistor electrically connected to the ground voltage. 4. The circuit of claim 1, wherein a drain-off current (Id_off) of an NMOS transistor is measured with the gate and source of the first NMOS transistor electrically connected to the ground voltage, and the drain of the first NMOS transistor electrically connected to the feedback node. 5. The circuit of claim 1, wherein a gate-off current (Ig_off) of a PMOS transistor is measured with the gate of the third PMOS transistor electrically connected to the feedback node, the source and bulk of the third PMOS transistor electrically connected to the second supply voltage, and the drain of the third PMOS transistor electrically connected to the ground voltage. 6. The circuit of claim 1, wherein a source-off current (Is_off) of a PMOS transistor is measured with the gate and bulk of the third PMOS transistor electrically connected to the second supply voltage, the source of the third PMOS transistor electrically connected to the feedback node, and the drain of the third PMOS transistor electrically connected to the ground voltage. 7. The circuit of claim 1, wherein a bulk-off current (Ib_off) of a PMOS transistor is measured with the gate and source of the third PMOS transistor electrically connected to the second supply voltage, the bulk of the third PMOS transistor electrically connected to the feedback node, and the drain of the third PMOS transistor electrically connected to the ground voltage.