IPC분류정보
국가/구분 |
United States(US) Patent
등록
|
국제특허분류(IPC7판) |
|
출원번호 |
US-0430916
(2017-02-13)
|
등록번호 |
US-10161865
(2018-12-25)
|
우선권정보 |
KR-10-2016-0088759 (2016-07-13) |
발명자
/ 주소 |
|
출원인 / 주소 |
|
대리인 / 주소 |
Kile Park Reed & Houtteman PLLC
|
인용정보 |
피인용 횟수 :
0 인용 특허 :
10 |
초록
▼
An illumination system for recognizing material includes a measurement stage, a light-providing part, a light-receiving part, and a processing part. The measurement stage is upwardly open and the measurement target is located on the measurement stage. The light-providing part includes a plurality of
An illumination system for recognizing material includes a measurement stage, a light-providing part, a light-receiving part, and a processing part. The measurement stage is upwardly open and the measurement target is located on the measurement stage. The light-providing part includes a plurality of illumination sections providing incident lights to the measurement target, and provides multi-directional incident lights to the measurement target from multiple upper directions at which the measurement stage is open. The light-receiving part receives single-directional reflection lights reflected by the measurement target according to the multi-directional incident lights provided by the light-providing part. The processing part acquires a multi-directional intensity distribution of multi-directional reflection lights reflected by the measurement target according to a single-directional incident light from the single-directional reflection lights reflected by the measurement target according to the multi-directional incident lights, and determines material of the measurement target from the multi-directional intensity distribution of reflection lights. Thus, material of an object may be easily and accurately known at a low cost.
대표청구항
▼
1. An illumination system for recognizing material comprising: a measurement stage that is upwardly open and on which the measurement target is located;a light-providing part including a plurality of illumination sections providing incident lights to the measurement target, and providing multi-direc
1. An illumination system for recognizing material comprising: a measurement stage that is upwardly open and on which the measurement target is located;a light-providing part including a plurality of illumination sections providing incident lights to the measurement target, and providing multi-directional incident lights to the measurement target from multiple upper directions at which the measurement stage is open;a light-receiving part receiving single-directional reflection lights reflected by the measurement target according to the multi-directional incident lights provided by the light-providing part; anda processing part processing the received single-directional reflection lights reflected by the measurement target according to the multi-directional incident lights to acquire a multi-directional intensity distribution of multi-directional reflection lights reflected by the measurement target according to a single-directional incident light, and determining material of the measurement target from the multi-directional intensity distribution of reflection lights,wherein the light-providing part includes a plurality of first illumination sections covering at least a portion of the multiple upper directions at which the measurement stage is open,the first illumination sections form at least a portion of a dome shape or a plate shape,a first opening portion is formed through a shape, of the first illumination sections, andthe light-receiving part is arranged so as to receive the reflection light reflected by the measurement target through the first opening portion,wherein the light-providing part further includes at least one second illumination section that provides incident light to the measurement target through the first opening portion, and is disposed so as to acquire the reflection light corresponding to a region of interest (ROI) including at least a portion of the measurement target,wherein a second opening portion is formed through a shape of the at least one second illumination section, andthe light-receiving part is arranged so as to receive the reflection light reflected by the measurement target through the second opening portion,wherein the light providing part further includes:a third illumination section providing incident light to the measurement target through the second opening portion; anda beam splitting unit that transmits the reflection lights to the light-receiving part and reflects the incident light generated from the third illumination section to provide the measurement target with the reflected incident light as an optical axis substantially the same as an optical axis of the light-receiving part. 2. The illumination system of claim 1, wherein the light-providing part includes a plurality of first illumination sections covering at least a portion of the multiple upper directions at which the measurement stage is open, and wherein the first illumination sections form at least a portion of a dome shape. 3. The illumination system of claim 1, wherein the light-providing part includes a plurality of first illumination sections covering at least a portion of the multiple upper directions at which the measurement stage is open, and wherein the first illumination sections form at least a portion of a plate shape, andwhen the incident lights generated from the first illumination sections are provided at a point on the measurement target, the point meeting an optical axis of the light-receiving part, sizes of the first illumination sections get smaller from a periphery toward a center of the measurement target such that solid angles of the incident lights covered by the sizes of the first illumination sections are uniform. 4. The illumination system of claim 3, wherein the light-providing part further includes a refractive medium unit disposed below the first illumination sections to refract the light generated from the first illumination sections so as to have a larger incident angle with respect to the measurement target. 5. The illumination system of claim 1, wherein the second illumination section is formed as a plurality of layers forming at least a portion of a plate shape. 6. The illumination system of claim 1, wherein each of the illumination sections includes: a base substrate;a plurality of light sources formed on the base substrate; anda diffuser disposed in front of the light sources to diffuse light generated from the light sources. 7. The illumination system of claim 1, wherein the light-receiving part receives reflection lights vertically and upwardly reflected from the measurement target so as to receive the reflection lights uniformly with respect to illumination directions of the incident lights. 8. The illumination system of claim 1, wherein the processing part determines the material of the measurement target from a first intensity distribution of specular reflection lights and a second intensity distribution of diffuse reflection lights, the first and second intensity distributions forming the multi-directional intensity distribution. 9. The illumination system of claim 8, wherein the processing part determines the material of the measurement target based on at least one parameter among an area of the first intensity distribution, an area of the second intensity distribution, a total area of the first and second intensity distributions, a reflection angle of the first intensity distribution, and a spreading angle of the first intensity distribution. 10. The illumination system of claim 9, wherein a value of the parameter is obtained on a coordinate system between reflection angle and reflection intensity. 11. The illumination system of claim 1, wherein determining material of the measurement target from the multi-directional intensity distribution of reflection lights involves determining whether the material is paper material or metal material.
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