ILLUMINATION SYSTEM FOR RECOGNIZING MATERIAL AND METHOD OF RECOGNIZING MATERIAL USING THE SAME
원문보기
IPC분류정보
국가/구분
United States(US) Patent
공개
국제특허분류(IPC7판)
G01N-021/47
G01N-021/55
출원번호
16229356
(2018-12-21)
공개번호
20190120759
(2019-04-25)
우선권정보
KR-10-2016-0088759 (2016-07-13)
발명자
/ 주소
SER, Jang-Il
출원인 / 주소
DeeDiim Sensors Inc.
인용정보
피인용 횟수 :
0인용 특허 :
0
초록▼
An illumination system includes a measurement stage on which a measurement target is located, a light-providing part having illumination sections providing multi-directional incident lights to the measurement target, a light-receiving part receiving single-directional reflection lights reflected by
An illumination system includes a measurement stage on which a measurement target is located, a light-providing part having illumination sections providing multi-directional incident lights to the measurement target, a light-receiving part receiving single-directional reflection lights reflected by the measurement target according to the multi-directional incident lights, and a processing part that performs acquiring a first distribution of intensities the single-directional reflection lights with respect to the multi-directional incident lights, acquiring, from the first distribution, a second distribution of intensities of multi-directional reflections lights with respect to a single-directional incident light, and determining material of the measurement target based on parameters of the second distribution. A method of recognizing material using the illumination system and a computer readable non-transitory recording medium recording a program embodying the method are provided.
대표청구항▼
1. An illumination system for recognizing material comprising: a measurement stage that is upwardly open and on which a measurement target is located;a light-providing part including a plurality of illumination sections providing multi-directional incident lights to the measurement target, the multi
1. An illumination system for recognizing material comprising: a measurement stage that is upwardly open and on which a measurement target is located;a light-providing part including a plurality of illumination sections providing multi-directional incident lights to the measurement target, the multi-directional incident lights having incident directions of incident angles, respectively;a light-receiving part receiving single-directional reflection lights reflected by the measurement target according to the multi-directional incident lights provided by the light-providing part; anda processing part that performs steps of: acquiring a first distribution of intensities the single-directional reflection lights with respect to the multi-directional incident lights;acquiring, from the first distribution, a second distribution of intensities of multi-directional reflections lights with respect to a single-directional incident light, wherein the multi-directional reflection lights of the second distribution have optical paths opposite to optical paths of the multi-directional incident lights of the first distribution, and the single-directional incident light of the second distribution has an optical path opposite to an optical path of the single-directional reflection lights of the first distribution; anddetermining material of the measurement target based on parameters of the second distribution. 2. The illumination system of claim 1, wherein the light-providing part includes a plurality of first illumination sections covering at least a portion of multiple upper directions at which the measurement stage is open, wherein the first illumination sections form at least a portion of a dome shape. 3. The illumination system of claim 1, wherein the light-providing part includes a plurality of first illumination sections covering at least a portion of multiple upper directions at which the measurement stage is open, wherein the first illumination sections form at least a portion of a plate shape, andwherein the multi-directional incident lights generated from the first illumination sections are provided at a point on the measurement target, the point meets an optical axis of the light-receiving part, and sizes of the first illumination sections vary in such a manner that sections closer to a center of the measurement target are smaller than sections farther from the center of the measurement target so that solid angles of the incident lights covered by the first illumination sections are uniform. 4. The illumination system of claim 3, wherein the light-providing part further includes a refractive medium unit disposed below the first illumination sections to refract light generated from the first illumination sections so as to have a larger incident angle with respect to the measurement target. 5. The illumination system of claim 1, wherein the light-providing part includes a plurality of first illumination sections covering at least a portion of multiple upper directions at which the measurement stage is open, wherein the first illumination sections form at least a portion of a dome shape or a plate shape,a first opening portion is formed through a shape of the first illumination sections, andthe light-receiving part is arranged so as to receive the reflection light reflected by the measurement target through the first opening portion. 6. The illumination system of claim 5, wherein the light-providing part further includes at least one second illumination section that provides incident light to the measurement target through the first opening portion, and is configured to acquire the reflection light corresponding to a region of interest (ROI) including at least a portion of the measurement target. 7. The illumination system of claim 6, wherein the at least one second illumination section is formed as a plurality of layers forming at least a portion of a plate shape. 8. The illumination system of claim 6, wherein a second opening portion is formed through a shape of the at least one second illumination section, and the light-receiving part is arranged so as to receive the reflection light reflected by the measurement target through the second opening portion. 9. The illumination system of claim 5, wherein the light providing part further includes: a subsidiary illumination section providing incident light to the measurement target through the first opening portion; anda beam splitting unit that transmits the reflection lights to the light-receiving part and reflects the incident light generated from the subsidiary illumination section to provide the measurement target with the reflected incident light as an optical axis substantially the same as an optical axis of the light-receiving part. 10. The illumination system of claim 2, wherein each of the first illumination sections includes: a base substrate;a plurality of light sources formed on the base substrate; anda diffuser disposed in front of the light sources to diffuse light generated from the light sources. 11. The illumination system of claim 1, wherein the light-receiving part receives the single-directional reflection lights vertically and upwardly reflected from the measurement target, the single-directional reflection lights being uniformly received with respect to illumination directions of the incident lights. 12. The illumination system of claim 1, wherein the parameters are acquired from a first intensity distribution of specular reflection lights and a second intensity distribution of diffuse reflection lights, the first and second intensity distributions forming the second distribution. 13. The illumination system of claim 12, wherein the parameters include at least one of an area of the first intensity distribution, an area of the second intensity distribution, a total area of the first and second intensity distributions, a reflection angle of the first intensity distribution, and a spreading angle of the first intensity distribution. 14. The illumination system of claim 13, wherein a value of each of the parameters is obtained on a coordinate system between reflection angle and reflection intensity. 15. A method of recognizing material using an illumination system, comprising: providing, by a light-providing device, multi-directional incident lights toward a measurement target, the multi-directional incident lights having incident directions of incident angles, respectively;receiving, by a light-receiving device, single-directional reflection lights reflected from the measurement target;acquiring, by a processor, a first distribution of intensities of the single-directional reflection lights with respect to the multi-directional incident lights;acquiring from the first distribution, by the processor, a second distribution of intensities of the multi-directional reflection lights with respect to a single-directional incident light, wherein the multi-directional reflection lights of the second distribution have optical paths opposite to optical paths of the multi-directional incident lights of the first distribution, and the single-directional incident light of the second distribution has an optical path opposite to an optical path of the single-directional reflection lights of the first distribution; anddetermining, by the processor, material of the measurement target based on parameters of the second distribution. 16. The method of claim 15, wherein the parameters are acquired from a first intensity distribution of specular reflection lights and a second intensity distribution of diffuse reflection lights, the first and second intensity distributions form the second distribution, and wherein the parameters include at least one of an area of the first intensity distribution, an area of the second intensity distribution, a total area of the first and second intensity distributions, a reflection angle of the first intensity distribution, and a spreading angle of the first intensity distribution. 17. A computer readable non-transitory recording medium recording a program embodying the method of claim 15.
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