Surface structure and X-ray diffractogram of gelatinized potato starch on heating temperature, time and additives were investigated by Scanning Electron Microscopy (SEM) and X-ray diffractometry. The results obtained are as follows; Potato starch had an amylose content of 23.5%, and blue value of 0....
Surface structure and X-ray diffractogram of gelatinized potato starch on heating temperature, time and additives were investigated by Scanning Electron Microscopy (SEM) and X-ray diffractometry. The results obtained are as follows; Potato starch had an amylose content of 23.5%, and blue value of 0.41. Raw potato starch granuls showed egg form. Destruction of starch granuls increased as gelatinizing time and temperature increased. The degree of gelatinization of potato starch showed to be 90% by X-ray diffractomertry at $70^{\circ}C$. There were no significant differences in degree of gelatinization of potato starch on gelatinizing time and phosphate concentration at $70^{\circ}C$. The degree of gelatinization of sample prepared was higher in presence of phosphate than in absence of phosphate.
Surface structure and X-ray diffractogram of gelatinized potato starch on heating temperature, time and additives were investigated by Scanning Electron Microscopy (SEM) and X-ray diffractometry. The results obtained are as follows; Potato starch had an amylose content of 23.5%, and blue value of 0.41. Raw potato starch granuls showed egg form. Destruction of starch granuls increased as gelatinizing time and temperature increased. The degree of gelatinization of potato starch showed to be 90% by X-ray diffractomertry at $70^{\circ}C$. There were no significant differences in degree of gelatinization of potato starch on gelatinizing time and phosphate concentration at $70^{\circ}C$. The degree of gelatinization of sample prepared was higher in presence of phosphate than in absence of phosphate.
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