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NTIS 바로가기電子工學會論文誌. Journal of the Institute of Electronics Engineers of Korea. SD, 반도체, v.37 no.12, 2000년, pp.50 - 59
윤도현 (LG電子) , 김홍식 (延世大學校 電氣電子工學科) , 강성호 (延世大學校 電氣電子工學科)
This paper presents a new SRAM testing method for various faults by monitoring dynamic power supply currents. The peak value of Iddt pulses when the transition write operation is performed, is prominently different from that of a fault free case. Using the observation, a new memory test algorithm is...
A.J. Goor, Testing Semiconductor Memories: Theory and Practice, John Wiley & Sons, Singapore, 1996
A. J Goor, 'Using March Tests to Test SRAMs,' IEEE Design & Test of Computers, pp. 8-14, March 1993
J. M. Soden, C. F. Hawkins, R. K. Gulati, and W. Mao, 'Iddq Testing: A Review,' Journal of Electrical Testing: Theory and Applications, pp. 291-203, 1992
S. Su, and R. Z. Makki, 'Testing of Static Random Access Memories by Monitoring Dynamic Power Supply Current,' Journal of Electronic Testing: Theory and Applications, pp. 265-278, 1992
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