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NTIS 바로가기Journal of semiconductor technology and science, v.13 no.3, 2013년, pp.245 - 251
Wu, Meile (School of Information Science and Engineering, Shenyang University of Technology) , Jin, Xiaoshi (School of Information Science and Engineering, Shenyang University of Technology) , Kwon, Hyuck-In (School of Electrical and Electronics Engineering, Chung-Ang University) , Chuai, Rongyan (School of Information Science and Engineering, Shenyang University of Technology) , Liu, Xi (School of Information Science and Engineering, Shenyang University of Technology) , Lee, Jong-Ho (School of EECS Eng. and ISRC (Inter-University Semiconductor Research Center), Seoul National University)
The effect of band-to-band tunneling (BTBT) leads to an obvious increase of the leakage current of junctionless (JL) transistors in the OFF state. In this paper, we propose an effective method to decline the influence of BTBT with the example of n-type double gate (DG) JL metal-oxide-semiconductor f...
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