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NTIS 바로가기마이크로전자 및 패키징 학회지 = Journal of the Microelectronics and Packaging Society, v.30 no.2, 2023년, pp.52 - 59
손기락 ((유) 스태츠칩팩코리아) , 김가희 (안동대학교 신소재공학부 청정에너지소재기술연구센터) , 박영배 (안동대학교 신소재공학부 청정에너지소재기술연구센터)
The effects of dielectric curing temperature and temperature/humidity treatment conditions on the interfacial adhesion energies between Ti diffusion barrier/polybenzoxazole (PBO) dielectric layers were systematically investigated for Cu redistribution layer applications of fan-out wafer level packag...
S. E. Kim, "Heterogeneous Device Packaging Technology for?the Internet of Things Applications(in Kor.)", J. Microelectron. Packag. Soc., 23(3), 1 (2016).
G. Kim, J. Lee, S. H. Park, S. Kang, T. S. Kim, and Y. B.?Park, "Comparison of Quantitative Interfacial Adhesion Energy?Measurement Method between Copper RDL and WPR?Dielectric Interface for FOWLP Applications(in Kor.)", J.?Microelectron. Packag. Soc., 25(2), 41 (2018).
E. J. Vardaman, "FO-WLP Market and Technology Trends",?Proc. 2017 International Conference on Electronics Packaging?(ICEP), Tendo, 318, IEEE (2017).
T. Hwang, D. Oh, E. Song, K. Kim, J. Kim, and S. Lee,?"Study of Advanced Fan-Out Packages for Mobile Applications", Proc. 68th 2018 Electronic Components and Technology Conference (ECTC), San Diego, 343, IEEE (2018).
V. S. Rao, C. T. Chong, D. Ho, and D. M. Zhi, "Process and?Reliability of Large Fan-Out Wafer Level Package based?Package-on-Package", Proc. 67th Electronic Components and?Technology Conference (ECTC), Orlando, 615, IEEE (2017).
Z. Chen, F. Che, M. Z. Ding, D. S. W. Ho, T. C. Chai, and?V. Srinivasa, "Drop Impact Reliability Test and Failure Analysis for Large Size High Density FOWLP Package on Package", Proc. 67th Electronic Components and Technology?Conference (ECTC), Orlando, 1196, IEEE (2017).
T. Fujiwara, Y. Shoji, Y. Masuda, K. Hashimoto, Y. Koyama,?K. Isobe, H. Araki, R. Okuda, and M. Tomikawa, "Higher?Reliability for Low-temperature Curable Positive-Tone Photodefinable Dielectric Materials", Proc. 19th Electronics Packaging Technology Conference (EPTC), Singapore, IEEE (2017).
T. Enomoto, S. Abe, D. Matsukawa, T. Nakamura, N. Yamazaki,?N. Saito, M. Ohe, and T. Motobe, "Recent Progress in Low?Temperature Curable Photosensitive Dielectric", Proc. 2017?International Conference on Electronics Packaging (ICEP),?Tendo, 498, IEEE (2017).
M. Topper, T. Fischer, V. Bader, K. D. Lang, N. Matsuie, T.?Motobe, T. Minegishi, and M. Knaus, "Ultra low temperature?PBO polymer for wafer level packaging application", Proc.?2011 International Conference on Electronics Packaging(ICEP),?Kyoto, 452, IEEE (2011).
Y. Shoji, Y. Masuda, K. Hashimoto, K. Isobe, Y. Koyama, and?R. Okuda, "Development of novel low-temperature curable?positive-tone photosensitive dielectric materials with high?elongation", Proc. 66th Electronic Components and Technology Conference(ECTC), Las Vegas, 1707, IEEE (2016).
T. Sasaki, "Low temperature curable polymide for advanced?package", J. Photopolym. Sci. Technol., 29(3), 379 (2016).
R. Rubner, "Innovation via photosensitive polyimide and?poly(benzoxazole) percursors - a review by inventor", J. Photopolym. Sci. Technol., 17(5), 685 (2004).
N. Anzai, M. Fujita, and A. Fujii, "Drop test and TCT reliability of buffer coating material for WLCSP", Proc. 64th?Electronic Components and Technology Conference(ECTC),?FL, 829, IEEE (2014).
M. Yoshida, T. Hirata, M. Fujita, N. Anzai, and N. Tamura,?"Highmudulus negative photosensitive polyimide for i-line",?J. Photopolym. Sci. technol., 27(2), 207 (2014).
M. Amagai, M. Ohsumi, E. Kawasaki, R. Baumann, and H.?Kitagawa, "The Effect of Polyimide Surface Morphology and?Chemistry on Package Cracking Induced by Interfacial?Delamination," Proc. 1994 IEEE International Reliability?Physics Symposium(IRPS), USA, 101, IEEE (1994).
J. H. Cho, D. I. Kong, C. E. Park, and M. Y. Jin, "Effect of?curing temperature on the adhesion strength of polyamideimide/copper joints", J. Adhesion Sci. Technol., 12(5), 507 (1998).
H. Araki, Y. Shoji, Y. Masuda, K. Hashimoto, K Matsumura,?Y. Koyama, and M. Tomikawa, "Fabrication of Redistribution?Structure using Highly Reliable Photosensitive Polyimide for?Fan Out Panel Level Packages", Proc. 15th International?Wafer-Level Packaging Conference(IWLPC), San Jose, IEEE?(2018).
Y. Koyama, Y. Shoji, K. Hashimoto, Y. Masuda, H. Araki,?and M. Tomikawa, "Development of Novel Low-temperature?Curable Positive-Tone Photosensitive Dielectric Materials?with High Reliability", Proc. 69th Electronic Components and?Technology Conference (ECTC), Las Vegas, 346, IEEE (2019).
Y. Chung, S. Lee, C. Mahata, J. Seo, S. -M. Lim, M. Jeong,?H, Jung, Y, -C, Joo, Y, B, Park, H. Kim and T. Lee, "Coupled?self-assembled monolayer for enhancement of Cu diffusion?barrier and adhesion properties", RSC Adv., 4, 60123 (2014).
M. Jeong, B. -H. Bae, H. Lee H. -O. Kang, W. -J. Hwang,?J. -M. Yang, and Y. B. Park, "Effects of post-annealing and?temperature/humidity treatments on the interfacial adhesion?energy of the Cu/SiNx interface for Cu interconnects", Jpn. J.?Appl. Phys., 55, 06JD01 (2016).
K. Son, Y. -H. Kim, S. -H. Kim, and Y. B. Park, "Interfacial?adhesion energies of Ru-Mn direct plateable diffusion barriers prepared by atomic layer deposition for advanced Cu interconnects", J. Mater. Sci.: Mater. Electron., 32, 20559 (2021).
R. Shaviv, S. Toham, and P. Woytowitz, "Optimizing the Precision of the Four-point Bend Test for the Measurement of?Thin-film Adhesion", Microelectronic Eng., 82(2), 99 (2005).
R. H. Dauskardt, M. Lane, Q. Ma, and N. Krishna, "Adhesion?and debonding of multi-layer thin film structures", Engng.?Fract. Mech., 61(1), 141 (1998).
P. G. Charalambides, J. Lund, A. G. Evans, and R. M.?McMeeking, "A Test Specimen for Determining the Fracture?Resistance of Bimaterial Interfaces", J. Appl. Mech., 56(1),?77 (1989).
A. L. Ruoff, E. J. Kramer, and C. Y. Li, "Improvement of?adhesion of copper on polyimide by reactive ion-beam etching", IBM J. Res. Develop., 32(5), 626 (1988).
R. Flitsch and D. Shih, "A study of modified polyimide surfaces as related to adhesion", J. Vac. Sci. Technol. A, 8(3),?2376 (1990).
H. Wang, S. Liu, T. S. Chung, H. Chen, Y. C. Jean, and K.?P. Pramod, "The evolution of poly(hydroxyamide amic acid)?to poly(benzoxazole) via stepwise thermal cyclization: Structural changes and gas transport properties", Polymer, 52(22),?5127 (2011).
S. L. C. Hsu and W. C. Chen, "A novel positive photosensitive polybenzoxazole precursor for microelectronic applications", Polymer, 43(25), 6743 (2002).
J. E. Graya, P. R. Norton, K. Griffiths, "Mechanism of adhesion of electroless-deposited silver on poly(ether urethane)",?Thin Solid Films, 484, 196 (2005).
K. Son, G. Kim, D. Kim, and Y. B. Park, "Effect of Surface?Treatments on the Interfacial Adhesion of Cu RDL for?FOWLP", Proc. 18th International Symposium on Microelectronics and Packaging (ISMP), Busan (2019).
S. C. Park, and Y. B. Park, "Effect of Temperature/Humidity?Treatment Conditions on Interfacial Adhesion Energy between?Inkjet-Printed Ag and Polyimide", Jpn. J. Appl. Phys., 48(8),?08HL02 (2009).
K. J. Min, M. H. Jeong, K. H. Lee, Y. S. Jeong, and Y. B.?Park, "Effect of Temperature/Humidity Treatment Conditions?on Interfacial Adhesion of Electroless-plated Ni on Polyimide(in Kor.)", J. Kor. Inst. Met. Mater., 47(10), 675 (2009).
D.-C. Hu, H.-C. Chen, "Humidity effect on polyimide film?adhesion", J. Mater. Sci., 27(19), 5262 (1992).
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