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NTIS 바로가기Procedia CIRP, v.93, 2020년, pp.1502 - 1507
Xie, Nan (Sino-German College of Applied Science, Tongji University) , Kou, Rui (Institute of Advanced Manufacturing Technology, Tongji University) , Yao, Yingzhe (Sino-German College of Applied Science, Tongji University)
Abstract Based on the interconnection of physical and virtual devices, the fault prognostic driven by Digital twin becomes a new methodology that diagnoses fault phenomena quickly. In this paper, a tool condition prognostic model based on digital twin(TCP-DT) is proposed to improve prognostic accur...
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