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IEEE transactions on reliability, v.61 no.1, 2012년, pp.254 - 263
Tao Yuan (Dept. of Ind. & Syst. Eng., Ohio Univ., Athens, OH, USA) , Xi Liu (Dept. of Ind. & Syst. Eng., Ohio Univ., Athens, OH, USA) , Way Kuo (City Univ. of Hong Kong, Hong Kong, China)
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This study proposes Bayesian methods for planning optimal simple step-stress accelerated life tests. The Bayesian approach is an attractive alternative to the maximum likelihood method when there is uncertainty in the planning values of the model parameters. The uncertainty in the planning values is...
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