최소 단어 이상 선택하여야 합니다.
최대 10 단어까지만 선택 가능합니다.
다음과 같은 기능을 한번의 로그인으로 사용 할 수 있습니다.
NTIS 바로가기IEEE transactions on reliability, v.61 no.1, 2012년, pp.254 - 263
Tao Yuan (Dept. of Ind. & Syst. Eng., Ohio Univ., Athens, OH, USA) , Xi Liu (Dept. of Ind. & Syst. Eng., Ohio Univ., Athens, OH, USA) , Way Kuo (City Univ. of Hong Kong, Hong Kong, China)
This study proposes Bayesian methods for planning optimal simple step-stress accelerated life tests. The Bayesian approach is an attractive alternative to the maximum likelihood method when there is uncertainty in the planning values of the model parameters. The uncertainty in the planning values is...
Hurvich, Clifford M., Simonoff, Jeffrey S., Tsai, Chih‐Ling. Smoothing parameter selection in nonparametric regression using an improved Akaike information criterion. Journal of the Royal Statistical Society Series B, Statistical methodology, vol.60, no.2, 271-293.
Muller, P., Parmigiani, G., Robert, C., Rousseau, J.. Optimal Sample Size for Multiple Testing: The Case of Gene Expression Microarrays. Journal of the American Statistical Association, vol.99, no.468, 990-1001.
Reliability characterization and prediction of high k dielectric thin film luo 2004
Rene van Dorp, J., Mazzuchi, T.A., Fornell, G.E., Pollock, L.R.. A Bayes approach to step-stress accelerated life testing. IEEE transactions on reliability, vol.45, no.3, 491-498.
René Van Dorp, J., Mazzuchi, Thomas A.. A general Bayes weibull inference model for accelerated life testing. Reliability engineering & system safety, vol.90, no.2, 140-147.
Lee, Jinsuk, Pan, Rong. Analyzing step-stress accelerated life testing data using generalized linear models. IIE transactions, vol.42, no.8, 589-598.
Miller, Robert, Nelson, Wayne. Optimum Simple Step-Stress Plans for Accelerated Life Testing. IEEE transactions on reliability, vol.r32, no.1, 59-65.
Bai, D.S., Kim, M.S., Lee, S.H.. Optimum simple step-stress accelerated life tests with censoring. IEEE transactions on reliability, vol.38, no.5, 528-532.
Khamis, I.H., Higgins, J.J.. Optimum 3-step step-stress tests. IEEE transactions on reliability, vol.45, no.2, 341-345.
Yeo, Kwee-Poo, Tang, Loon-Ching. Planning step-stress life-test with a target acceleration-factor. IEEE transactions on reliability, vol.48, no.1, 61-67.
10.1002/1520-6750(199303)40:2<193::AID-NAV3220400205>3.0.CO;2-J
Ma, Haiming, Meeker, William Q.. Optimum step-stress accelerated life test plans for log-location-scale distributions. Naval research logistics : NRL, vol.55, no.6, 551-562.
Journal of Quality Technology Planning and inference for a sequential accelerated life test tand 2010 10.1080/00224065.2010.11917809 42 103
Xiong, Chengjie, Milliken, G.A.. Step-stress life-testing with random stress-change times for exponential data. IEEE transactions on reliability, vol.48, no.2, 141-148.
Xiong, C.. Inferences on a simple step-stress model with type-II censored exponential data. IEEE transactions on reliability, vol.47, no.2, 142-146.
Journal of Quality Technology Point and interval estimation for a simple step-stress model with type-II censoring balakrishnan 2007 10.1080/00224065.2007.11917671 39 35
Xiong, Chengjie, Zhu, Kejun, Ji, Ming. Analysis of a simple step-stress life test with a random stress-change time. IEEE transactions on reliability, vol.55, no.1, 67-74.
Kateri, M., Balakrishnan, N.. Inference for a Simple Step-Stress Model With Type-II Censoring, and Weibull Distributed Lifetimes. IEEE transactions on reliability, vol.57, no.4, 616-626.
Nelson, Wayne. Accelerated Life Testing - Step-Stress Models and Data Analyses. IEEE transactions on reliability, vol.r29, no.2, 103-108.
Statistical Methods for Reliability Data meeker 1998
Khamis, I.H., Higgins, J.J.. A new model for step-stress testing. IEEE transactions on reliability, vol.47, no.2, 131-134.
Fard, N., Li, C.. Optimal simple step stress accelerated life test design for reliability prediction. Journal of statistical planning and inference, vol.139, no.5, 1799-1808.
Alhadeed, A.A., Yang, Shie-Shien. Optimal simple step-stress plan for cumulative exposure model using log-normal distribution. IEEE transactions on reliability, vol.54, no.1, 64-68.
Zhang, Yao, Meeker, William Q.. Bayesian life test planning for the Weibull distribution with given shape parameter. Metrika, vol.61, no.3, 237-249.
Alhadeed, A.A., Yang, Shie-Shien. Optimal simple step-stress plan for Khamis-Higgins model. IEEE transactions on reliability, vol.51, no.2, 212-215.
Erkanli, Alaattin, Soyer, Refik. Simulation-based designs for accelerated life tests. Journal of statistical planning and inference, vol.90, no.2, 335-348.
Liu, Xiao, Tang, Loon‐Ching. A Bayesian optimal design for accelerated degradation tests. Quality and reliability engineering international, vol.26, no.8, 863-875.
Technometrics Bayesian methods for planning accelerated life tests zhang 2006 10.1198/004017005000000373 48 49
IEEE Trans Reliability Accelerated life test plans for repairable systems with multiple independent risks liu 2010 10.1109/TR.2010.2040758 59 115
*원문 PDF 파일 및 링크정보가 존재하지 않을 경우 KISTI DDS 시스템에서 제공하는 원문복사서비스를 사용할 수 있습니다.
※ AI-Helper는 부적절한 답변을 할 수 있습니다.