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Microelectronics reliability, v.64, 2016년, pp.109 - 112
Shin, D. , Bae, M.S. , Yun, I.
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Degradation mechanism of foldable thin film transistors (TFTs) is investigated experimentally by electrical, mechanical and electrical-mechanical hybrid stress experiments. Mechanical and electrical stress environment was set for foldable TFTs and the degradation effect according to the applied stre...
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