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NTIS 바로가기대한금속 . 재료학회지 = Korean journal of metals and materials, v.57 no.2, 2019년, pp.124 - 129
Jang, Yong Ju , Shin, Hyeon-Jin , Wi, Seong Ju , Kim, Ha Neul , Lee, Gi Sung , Ahn, Jinho
초록이 없습니다.
Khoshnoud, F., de Silva, C. W.. Recent advances in MEMS sensor technology-mechanical applications. IEEE instrumentation & measurement magazine, vol.15, no.2, 14-24.
Kim, Min Gyeom, Hong, Tae Whan. Evaluations of Hydrogen Permeation on Ni-SCYb Nano-Composites Membrane by Sol-Gel Methods. 대한금속 . 재료학회지 = Korean journal of metals and materials, vol.56, no.5, 406-411.
Miller, L M, Halvorsen, E, Dong, T, Wright, P K. Modeling and experimental verification of low-frequency MEMS energy harvesting from ambient vibrations. Journal of micromechanics and microengineering.: structures, devices, and systems, vol.21, no.4, 045029-.
Ghaderi, Mohammadamir, Wolffenbuttel, Reinoud F.. Design and fabrication of ultrathin silicon-nitride membranes for use in UV-visible airgap-based MEMS optical filters. Journal of physics. Conference series, vol.757, 012032-.
Kim, Kyoungjin. Analysis of Self-Propagating Intermetallic Reaction in Nanoscale Multilayers of Binary Metals. Metals and materials international, vol.23, no.2, 326-335.
Kim, Jung Sik, Ahn, Jinho. Mask Materials and Designs for Extreme Ultra Violet Lithography. Electronic materials letters, vol.14, no.5, 533-547.
Zwol 2017
Hong 2018
Greer, Julia R., Oliver, Warren C., Nix, William D.. Size dependence of mechanical properties of gold at the micron scale in the absence of strain gradients. Acta materialia, vol.53, no.6, 1821-1830.
Jang, Dongchan, Greer, Julia R.. Transition from a strong-yet-brittle to a stronger-and-ductile state by size reduction of metallic glasses. Nature materials, vol.9, no.3, 215-219.
Edalatpour, S., Francoeur, M.. Size effect on the emissivity of thin films. Journal of quantitative spectroscopy & radiative transfer, vol.118, 75-85.
Vlassak, J.J., Nix, W.D.. A new bulge test technique for the determination of Young's modulus and Poisson's ratio of thin films. Journal of materials research, vol.7, no.12, 3242-3249.
Xiang, Y., Chen, X., Vlassak, J.J.. Plane-strain Bulge Test for Thin Films. Journal of materials research, vol.20, no.9, 2360-2370.
Edwards, R. L., Coles, G., Sharpe Jr, W. N.. Comparison of tensile and bulge tests for thin-film silicon nitride. Experimental mechanics, vol.44, no.1, 49-54.
Merle, B., Goken, M.. Fracture toughness of silicon nitride thin films of different thicknesses as measured by bulge tests. Acta materialia, vol.59, no.4, 1772-1779.
Gao, Huajian, Ji, Baohua, Jäger, Ingomar L., Arzt, Eduard, Fratzl, Peter. Materials become insensitive to flaws at nanoscale: Lessons from nature. Proceedings of the National Academy of Sciences of the United States of America, vol.100, no.10, 5597-5600.
Lee, Hyung-Cheol, Kim, Eun-Jin, Kim, Ji-Won, Oh, Hye-Keun. Temperature behavior of pellicles in extreme ultraviolet lithography. Journal of the Korean Physical Society, vol.61, no.7, 1093-1096.
van Zwol, P. J., Vles, D. F., Voorthuijzen, W. P., Péter, M., Vermeulen, H., van der Zande, W. J., Sturm, J. M., van de Kruijs, R. W. E., Bijkerk, F.. Emissivity of freestanding membranes with thin metal coatings. Journal of applied physics, vol.118, no.21, 213107-.
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