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Photo-CVD system 원문보기

IPC분류정보
국가/구분 United States(US) Patent 등록
국제특허분류(IPC7판)
  • C23C-016/00
  • C23C-016/48
출원번호 US-0822361 (1992-01-17)
발명자 / 주소
  • Rhieu Ji H. (Mesa AZ)
출원인 / 주소
  • Amtech Systems, Inc. (Tempe AZ 02)
인용정보 피인용 횟수 : 30  인용 특허 : 0

초록

A photo-assisted chemical vapor deposition system includes a reaction chamber, a susceptor in the reaction chamber supporting a wafer, a source for introducing reactant gas into the reaction chamber through an inlet port, and a cover positioned in sealed relationship to the housing and partially bou

대표청구항

A photo-assisted chemical vapor deposition system, comprising in combination: (a) a reaction chamber having a housing; (b) a susceptor in the reaction chamber supporting a substrate, such as a semiconductor wafer; (c) means for introducing reactant gas into the reaction chamber through an inlet port

이 특허를 인용한 특허 (30)

  1. Gat Arnon ; Champetier Robert J. ; Fabian Ram Z.,ILX, Apparatus and method for filtering light in a thermal processing chamber.
  2. Scott, Gary Michael, Cargo bar.
  3. Gronet Christian M. (Palo Alto CA) Gibbons James F. (Palo Alto CA), Cooling chamber for a rapid thermal heating apparatus.
  4. Hathaway Kevin, Heating device containing a multi-lamp cone for heating semiconductor wafers.
  5. Gat, Arnon; Bogart, Bob, Heating device for heating semiconductor wafers in thermal processing chambers.
  6. Gat, Arnon; Bogart, Bob, Heating device for heating semiconductor wafers in thermal processing chambers.
  7. Gat, Arnon; Bogart, Bob, Heating device for heating semiconductor wafers in thermal processing chambers.
  8. Gat, Arnon; Bogart, Bob; O'Carroll, Conor Patrick; Timans, Paul Janis; Choy, Shuen Chun; Koren, Zion; Bragg, Chris Francis, Heating device for heating semiconductor wafers in thermal processing chambers.
  9. Gat,Arnon; Bogart,Bob, Heating device for heating semiconductor wafers in thermal processing chambers.
  10. Gat Arnon, Heating device for semiconductor wafers.
  11. Vosen Steven R., Heating device for semiconductor wafers.
  12. Carlson, David Keith; Kuppurao, Satheesh; Beckford, Howard; Diniz, Herman; Patalay, Kailash Kiran; Burrows, Brian Hayes; Campbell, Jeffrey Ronald; Zhu, Zouming; Li, Xiaowei; Sanchez, Errol Antonio, Independent radiant gas preheating for precursor disassociation control and gas reaction kinetics in low temperature CVD systems.
  13. Helm John Thomas ; Medlin Arthur E., Mechanism for detecting particulate formation and/or failures in the removal of gas from a liquid.
  14. Brors Daniel L. ; Cook Robert C., Method and apparatus for cold wall chemical vapor deposition.
  15. Bahl Suneet, Method and apparatus for enhancing the efficiency of radiant energy sources used in rapid thermal processing of substrates by energy reflection.
  16. Igeta,Masanobu; Wajda,Cory; O'Meara,David L.; Scheer,Kristen; Eurakawa,Toshihara, Method and system for forming an oxynitride layer.
  17. Wajda, Cory S.; Scheer, Kristen; Furakawa, Toshihara, Method and system for forming an oxynitride layer by performing oxidation and nitridation concurrently.
  18. Kim Jeong Hyun (Seoul KRX), Method for forming semiconductor layer of thin film transistor by using temperature difference.
  19. Kim Jeong Hyun,KRX, Method for manfacturing a thin film transistor by using temperature difference.
  20. Eriguchi Koji,JPX, Method of monitoring deposit in chamber, method of plasma processing, method of dry-cleaning chamber, and semiconductor.
  21. Tavares, Jason Robert; Dorval Dion, Christopher Alex, Methods for the photo-initiated chemical vapor deposition (PICVD) of coatings and coatings produced by these methods.
  22. Das John H. ; Thakur Randhir P. S., Process for forming thin dielectric layers in semiconductor devices.
  23. Gronet Christian M. (Palo Alto CA) Gibbons James F. (Palo Alto CA), Rapid thermal heating apparatus and control therefor.
  24. Christian M. Gronet ; James F. Gibbons, Rapid thermal heating apparatus and method including an infrared camera to measure substrate temperature.
  25. Gronet Christian M. ; Gibbons James F., Rapid thermal heating apparatus and method including an infrared camera to measure substrate temperature.
  26. Gronet Christian M. ; Gibbons James F., Rapid thermal heating apparatus including a plurality of light pipes and a pyrometer for measuring substrate temperature.
  27. Sakata, Atsuko; Wada, Junichi; Omoto, Seiichi; Hatano, Masaaki; Yamashita, Soichi; Higashi, Kazuyuki; Nakamura, Naofumi; Yamada, Masaki; Kinoshita, Kazuya; Katata, Tomio; Hasunuma, Masahiko, Semiconductor device having oxidized metal film and manufacture method of the same.
  28. Sakata, Atsuko; Wada, Junichi; Omoto, Seiichi; Hatano, Masaaki; Yamashita, Soichi; Higashi, Kazuyuki; Nakamura, Naofumi; Yamada, Masaki; Kinoshita, Kazuya; Katata, Tomio; Hasunuma, Masahiko, Semiconductor device having oxidized metal film and manufacture method of the same.
  29. Wada, Junichi; Sakata, Atsuko; Omoto, Seiichi; Hatano, Masaaki; Yamashita, Soichi; Higashi, Kazuyuki; Nakamura, Naofumi; Yamada, Masaki; Kinoshita, Kazuya; Katata, Tomio; Hasunuma, Masahiko, Semiconductor device having oxidized metal film and manufacture method of the same.
  30. Eriguchi Koji,JPX, Semiconductor manufacturing apparatus.
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