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[미국특허] Semiconductor device having a passivation layer 원문보기

IPC분류정보
국가/구분 United States(US) Patent 등록
국제특허분류(IPC7판)
  • H01L-031/0312
  • H01L-023/58
출원번호 US-0678458 (1996-07-09)
발명자 / 주소
  • Harris Christopher,SEX
출원인 / 주소
  • ABB Research Ltd., CHX
대리인 / 주소
    Pollock, Vande Sande & Priddy
인용정보 피인용 횟수 : 67  인용 특허 : 5

초록

A semiconductor device comprising at least one SiC semiconductor layer; and passivation layers applied on at least a portion of a surface of the SiC semiconductor layer for passivation thereof; the passivation layers comprising at least a substantially insulating layer comprising crystalline AlN and

대표청구항

[ I claim:] [1.] A semiconductor device comprisingat least one SiC semiconductor layer, andpassivation layers applied on at least a portion of a surface of said SiC semiconductor layer for passivation thereof,said passivation layers comprising at least a substantially insulating layer comprising cry

이 특허에 인용된 특허 (5)

  1. Edmond John A. (Apex NC) Dmitriev Vladimir (Fuquay-Varina NC) Irvine Kenneth (Cary NC), Buffer structure between silicon carbide and gallium nitride and resulting semiconductor devices.
  2. Suzuki Akira (Nara JPX) Furukawa Katsuki (Sakai JPX) Shigeta Mitsuhiro (Joyo JPX) Fujii Yoshihisa (Nara JPX), Light emitting diode.
  3. Byatt Stephen W. (Manchester GB2), Method of passivating pn-junction in a semiconductor device.
  4. Biet ; Jean-Pierre Henri ; Laou ; Sio Dhat, Semiconductor device having a passivated surface and method of manufacturing the device.
  5. Harris Christopher (Sollentuna SEX) Konstantinov Andrei (Linkoping SEX) Janzen Erik (Borensberg SEX), Semiconductor device having a passivation layer.

이 특허를 인용한 특허 (67)

  1. Hunter Charles Eric, Bulk single crystals of aluminum nitride.
  2. Henning, Jason Patrick; Zhang, Qingchun; Ryu, Sei-Hyung; Agarwal, Anant; Palmour, John Williams; Allen, Scott, Edge termination structure employing recesses for edge termination elements.
  3. Schulten Michael,DEX, Electrically poorly conductive material for producing an insulation sleeve.
  4. Ryu, Sei-Hyung; Capell, Doyle Craig; Cheng, Lin; Dhar, Sarit; Jonas, Charlotte; Agarwal, Anant; Palmour, John, Field effect transistor devices with low source resistance.
  5. Ryu, Sei-Hyung; Capell, Doyle Craig; Cheng, Lin; Dhar, Sarit; Jonas, Charlotte; Agarwal, Anant; Palmour, John, Field effect transistor devices with low source resistance.
  6. Dhar, Sarit; Ryu, Sei-Hyung; Agarwal, Anant; Williams, John Robert, Forming SiC MOSFETs with high channel mobility by treating the oxide interface with cesium ions.
  7. Zhang, Qingchun, High breakdown voltage wide band-gap MOS-gated bipolar junction transistors with avalanche capability.
  8. Das, Mrinal K.; Lin, Henry; Schupbach, Marcelo; Palmour, John Williams, High current, low switching loss SiC power module.
  9. Das, Mrinal K.; Lin, Henry; Schupbach, Marcelo; Palmour, John Williams, High current, low switching loss SiC power module.
  10. Das, Mrinal K.; Callanan, Robert J.; Lin, Henry; Palmour, John Williams, High performance power module.
  11. Zhang, Qingchun; Ryu, Sei-Hyung; Jonas, Charlotte; Agarwal, Anant K., High power insulated gate bipolar transistors.
  12. Zhang, Qingchun; Ryu, Sei-Hyung; Jonas, Charlotte; Agarwal, Anant K., High power insulated gate bipolar transistors.
  13. Ryu, Sei-Hyung; Zhang, Qingchun, High voltage insulated gate bipolar transistors with minority carrier diverter.
  14. Ryu,Sei Hyung; Jenny,Jason R.; Das,Mrinal K.; Hobgood,Hudson McDonald; Agarwal,Anant K.; Palmour,John W., High voltage silicon carbide MOS-bipolar devices having bi-directional blocking capabilities.
  15. Ryu, Sei Hyung; Jenny, Jason R.; Das, Mrinal K.; Agarwal, Anant K.; Palmour, John W.; Hobgood, Hudson McDonald, High voltage silicon carbide devices having bi-directional blocking capabilities.
  16. Ryu,Sei Hyung; Jenny,Jason R.; Das,Mrinal K.; Hobgood,Hudson McDonald; Agarwal,Anant K.; Palmour,John W., High voltage silicon carbide devices having bi-directional blocking capabilities.
  17. Das, Mrinal Kanti; Lipkin, Lori A.; Palmour, John W.; Sheppard, Scott; Hagleitner, Helmut, High voltage, high temperature capacitor and interconnection structures.
  18. Zhang, Qingchun, Insulated gate bipolar transistors including current suppressing layers.
  19. Zhang, Qingchun, Insulated gate bipolar transistors including current suppressing layers.
  20. Zhang, Qingchun; Ryu, Sei-Hyung, Junction Barrier Schottky diodes with current surge capability.
  21. Lipkin Lori A. ; Palmour John Williams, Layered dielectric on silicon carbide semiconductor structures.
  22. Lipkin, Lori A.; Paimour, John Williams, Layered dielectric on silicon carbide semiconductor structures.
  23. Lori A. Lipkin ; John Williams Paimour, Layered dielectric on silicon carbide semiconductor structures.
  24. Lipkin, Lori A., Method of N2O annealing an oxide layer on a silicon carbide layer.
  25. Lipkin, Lori A.; Das, Mrinal Kanti; Palmour, John W., Method of N2O growth of an oxide layer on a silicon carbide layer.
  26. Das,Mrinal Kanti; Lipkin,Lori A., Method of fabricating an oxide layer on a silicon carbide layer utilizing an anneal in a hydrogen environment.
  27. Tsuji, Takashi, Method of manufacturing silicon carbide semiconductor device.
  28. Tsuji,Takashi, Method of manufacturing silicon carbide semiconductor device.
  29. Das,Mrinal Kanti; Lipkin,Lori A.; Palmour,John W.; Sheppard,Scott; Hagleitner,Helmut, Methods of fabricating high voltage, high temperature capacitor and interconnection structures.
  30. Das, Mrinal K.; Laughner, Michael, Methods of fabricating silicon carbide devices having smooth channels.
  31. Das, Mrinal K.; Laughner, Michael, Methods of fabricating silicon carbide devices having smooth channels.
  32. Das,Mrinal Kanti; Ryu,Sei Hyung, Methods of fabricating silicon carbide devices with hybrid well regions.
  33. Das, Mrinal K.; Hull, Brett; Krishnaswami, Sumi, Methods of forming SiC MOSFETs with high inversion layer mobility.
  34. Das, Mrinal K.; Hull, Brett; Krishnaswami, Sumi, Methods of forming SiC MOSFETs with high inversion layer mobility.
  35. Hull, Brett Adam; Zhang, Qingchun, Methods of forming semiconductor devices including epitaxial layers and related structures.
  36. Das,Mrinal Kanti; Saxler,Adam William, Nitrogen passivation of interface states in SiO/SiC structures.
  37. Henning, Jason Patrick; Zhang, Qingchun; Ryu, Sei-Hyung; Agarwal, Anant Kumar; Palmour, John Williams; Allen, Scott, Power module for supporting high current densities.
  38. Henning, Jason Patrick; Zhang, Qingchun; Ryu, Sei-Hyung; Agarwal, Anant Kumar; Palmour, John Williams; Allen, Scott, Power module having a switch module for supporting high current densities.
  39. Zhang, Qingchun; Richmond, James Theodore; Agarwal, Anant K.; Ryu, Sei-Hyung, Power switching devices having controllable surge current capabilities.
  40. Ryu, Sei-Hyung; Agarwal, Anant; Das, Mrinal Kanti; Lipkin, Lori A.; Palmour, John W.; Singh, Ranbir, SILICON CARBIDE POWER METAL-OXIDE SEMICONDUCTOR FIELD EFFECT TRANSISTORS HAVING A SHORTING CHANNEL AND METHODS OF FABRICATING SILICON CARBIDE METAL-OXIDE SEMICONDUCTOR FIELD EFFECT TRANSISTORS HAVING.
  41. Henning, Jason Patrick; Zhang, Qingchun; Ryu, Sei-Hyung; Agarwal, Anant Kumar; Palmour, John Williams; Allen, Scott, Schottky diode.
  42. Henning, Jason Patrick; Zhang, Qingchun; Ryu, Sei-Hyung; Agarwal, Anant Kumar; Palmour, John Williams; Allen, Scott, Schottky diode.
  43. Henning, Jason Patrick; Zhang, Qingchun; Ryu, Sei-Hyung; Agarwal, Anant; Palmour, John Williams; Allen, Scott, Schottky diode.
  44. Henning, Jason Patrick; Zhang, Qingchun; Ryu, Sei-Hyung; Agarwal, Anant; Palmour, John Williams; Allen, Scott, Schottky diode employing recesses for elements of junction barrier array.
  45. Zhang, Qingchun; Ryu, Sei-Hyung; Agarwal, Anant, Semiconductor devices including Schottky diodes having doped regions arranged as islands and methods of fabricating same.
  46. Hull, Brett Adam; Zhang, Qingchun, Semiconductor devices including epitaxial layers and related methods.
  47. Zhang, Qingchun; Henning, Jason, Semiconductor devices including schottky diodes having overlapping doped regions and methods of fabricating same.
  48. Zhang, Qingchun, Semiconductor devices with heterojunction barrier regions and methods of fabricating same.
  49. Zhang, Qingchun, Semiconductor devices with heterojunction barrier regions and methods of fabricating same.
  50. Zhang, Qingchun, Semiconductor devices with heterojunction barrier regions and methods of fabricating same.
  51. Zhang, Qingchun, Semiconductor devices with heterojunction barrier regions and methods of fabricating same.
  52. Bakowski Mietek,SEX ; Gustafsson Ulf,SEX ; Harris Christopher I.,SEX, SiC semiconductor device comprising a pn junction.
  53. Ryu, Sei-Hyung, Silicon carbide MOSFETs with integrated antiparallel junction barrier Schottky free wheeling diodes and methods of fabricating the same.
  54. Das, Mrinal K.; Laughner, Michael, Silicon carbide devices having smooth channels.
  55. Das, Mrinal K.; Laughner, Michael, Silicon carbide devices having smooth channels.
  56. Das, Mrinal Kanti; Ryu, Sei-Hyung, Silicon carbide devices with hybrid well regions.
  57. Ryu, Sei-Hyung; Agarwal, Anant K., Silicon carbide junction barrier Schottky diodes with suppressed minority carrier injection.
  58. Ryu,Sei Hyung, Silicon carbide power devices with self-aligned source and well regions.
  59. Ryu,Sei Hyung, Silicon carbide power devices with self-aligned source and well regions and methods of fabricating same.
  60. Chidambarrao, Dureseti; Dokumaci, Omer H.; Gluschenkov, Oleg, Silicon device on SI:C-OI and SGOI and method of manufacture.
  61. Chidambarrao, Duresti; Dokumaci, Omer H.; Gluschenkov, Oleg G., Silicon device on Si: C-oi and Sgoi and method of manufacture.
  62. Chidambarrao, Dureseti; Dokumaci, Omer H.; Gluschenkov, Oleg G., Silicon device on Si:C-OI and SGOI and method of manufacture.
  63. Callanan, Robert J.; Ryu, Sei-Hyung; Zhang, Qingchun, Solid-state pinch off thyristor circuits.
  64. Ryu, Sei-Hyung, Vertical JFET limited silicon carbide metal-oxide semiconductor field effect transistors.
  65. Ryu,Sei Hyung, Vertical JFET limited silicon carbide power metal-oxide semiconductor field effect transistors.
  66. Zhang, Qingchun, Wide band-gap MOSFETs having a heterojunction under gate trenches thereof and related methods of forming such devices.
  67. Zhang, Qingchun; Richmond, James Theodore; Callanan, Robert J., Wide bandgap bipolar turn-off thyristor having non-negative temperature coefficient and related control circuits.
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