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[미국특허] Sputtering device and sputtering method 원문보기

IPC분류정보
국가/구분 United States(US) Patent 등록
국제특허분류(IPC7판)
  • C23C-014/35
  • C23C-014/34
출원번호 US-0027217 (1998-02-20)
우선권정보 JP-0165214 (1997-06-06)
발명자 / 주소
  • Kobayashi Masahiko,JPX
  • Takahashi Nobuyuki,JPX
출원인 / 주소
  • Anelva Corporation, JPX
대리인 / 주소
    Burns, Doane, Swecker & Mathis, LLP
인용정보 피인용 횟수 : 74  인용 특허 : 17

초록

A sputtering device includes a chamber equipped with an exhaust system. A sputtering power source applies specific high frequency electric power to the target. A supplemental electrode is provided so that it surrounds the flight path of sputter particles between the target and a substrate. The suppl

대표청구항

[ What is claimed is:] [12.] A method of sputtering a substrate held by a substrate holder within a sputter chamber comprising the steps of:applying high-frequency electric power to a target thereby magnetron sputtering the target and creating sputter particles;holding a substrate in an incident pos

이 특허에 인용된 특허 (17)

  1. Barnes Michael S. (Mahopac NY) Forster John C. (Poughkeepsie NY) Keller John H. (Newburgh NY), Apparatus for depositing material into high aspect ratio holes.
  2. Deguchi Mikio (Itami JPX), Apparatus for producing semiconductor devices.
  3. Ghanbari Abe (W. Nyack NY) Ameen Michael (Cornwall NY), Control of the crystal orientation dependent properties of a film deposited on a semiconductor wafer.
  4. Givens John H. ; Leiphart Shane B., In situ preclean in a PVD chamber with a biased substrate configuration.
  5. Gerrish Kevin S. (Spencerport NY) Ballentine Paul H. (Austin TX) Heimanson Dorian (Rochester NY) Stephens ; II Alan T. (Dayton OH), Magnetic orienting device for thin film deposition and method of use.
  6. Wagner Israel (Monsey NY) Hurwitt Steven D. (Park Ridge NJ), Method and apparatus for improving the uniformity ion bombardment in a magnetron sputtering system.
  7. Kobayashi Masahiko (Tokyo JPX) Takahashi Nobuyuki (Tokyo JPX), Method for successive formation of thin films.
  8. Latz Rudolf (Frankfurt am Main DEX) Scherer Michael (Rodenbach DEX) Geisler Michael (Wchtersbach DEX) Jung Michael (Kahl DEX), Microwave cathode sputtering arrangement.
  9. Yamagami Atsushi (1-17-301 ; Komegabukuro 2-chome ; Aoba-ku Kawasaki JPX) Okamura Nobuyuki (1-17-301 ; Komegabukuro 2-chome ; Aoba-ku Kawasaki JPX) Ohmi Tadahiro (1-17-301 ; Komegabukuro 2-chome ; Ao, Plasma processing apparatus.
  10. Latz Rudolf (Rodgau-Dudenhofen DEX), Plasma sputtering installation with microwave enhancement.
  11. Nieh Simon K. (Monrovia CA) Matossian Jesse N. (Canoga Park CA) Krajenbrink Frans G. (Newbury Park CA), Plasma-enhanced magnetron-sputtered deposition of materials.
  12. Husler Alfons (Obertshausen DEX), Rotating magnetron cathode and method for the use thereof.
  13. Bonyhard Peter I. (San Martin CA) Cheng David C. (Palo Alto CA) Glover William J. (San Jose CA) Hendrix Howard A. (Livermore CA) Ward Ernest S. (San Jose CA) Williams John W. (San Jose CA), Sputtering apparatus.
  14. Hoshino Akira,JPX, Sputtering apparatus for forming a conductive film in a contact hole of a high aspect ratio.
  15. Setoyama Eiji (Hitachi JPX) Kamei Mitsuhiro (Hitachi JPX) Ohno Yasunori (Mito JPX), Sputtering apparatus for forming thin films.
  16. Tateishi Hideki (Yokohama JPX) Saito Hiroshi (Fujisawa JPX) Sasaki Shinji (Yokohama JPX) Horiuchi Mitsuaki (Hachioji JPX), Sputtering process and an apparatus for carrying out the same.
  17. Groechel David W. (Sunnyvale CA) Toshima Masato M. (Sunnyvale CA) Steger Robert J. (Cupertino CA) Wong Jerry Y. (Fremont CA) Ishikawa Tetsuya (Funabashi CA JPX) Tekeste Regga (San Jose CA) Ito Koichi, Uniformity for magnetically enhanced plasma chambers.

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