We report on the technology of formation of sandwich structures based on fullerite films and on experimental results in research of optical and conductivity properties of these sandwich samples. Single crystals of sapphire (100) or silicon were used as substrates. The sandwich specimens were based o...
We report on the technology of formation of sandwich structures based on fullerite films and on experimental results in research of optical and conductivity properties of these sandwich samples. Single crystals of sapphire (100) or silicon were used as substrates. The sandwich specimens were based on the structure M/$C_{60}$/M (M=Cr, Pd, Ag, Al, Cu). The thickness of the fullerite films was about $0.2{\sim}1.0{\mu}m$. The area of the $C_{60}$ film under the top contact was about $1cm^{2}$. The specimens have been investigated by infrared spectroscopy, spectra-photometry, ellipsometry and X-ray diffraction analysis. Measurements of the current/voltage characteristics and research on the temperature dependence of conductivity were performed as well. It was shown that metals such as Cr, Pd, Ag, Al, and Cu penetrate easily into the fullerite films. It appears that these specimens have a large conductivity. For silver/$C_{60}$ and other sandwich structures the conductivities show a semiconductor-like behaviour.
We report on the technology of formation of sandwich structures based on fullerite films and on experimental results in research of optical and conductivity properties of these sandwich samples. Single crystals of sapphire (100) or silicon were used as substrates. The sandwich specimens were based on the structure M/$C_{60}$/M (M=Cr, Pd, Ag, Al, Cu). The thickness of the fullerite films was about $0.2{\sim}1.0{\mu}m$. The area of the $C_{60}$ film under the top contact was about $1cm^{2}$. The specimens have been investigated by infrared spectroscopy, spectra-photometry, ellipsometry and X-ray diffraction analysis. Measurements of the current/voltage characteristics and research on the temperature dependence of conductivity were performed as well. It was shown that metals such as Cr, Pd, Ag, Al, and Cu penetrate easily into the fullerite films. It appears that these specimens have a large conductivity. For silver/$C_{60}$ and other sandwich structures the conductivities show a semiconductor-like behaviour.
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문제 정의
In this paper we report on the technology of formation of sandwich structures based on fullerite films and on experimental results in research of optical and conductivity properties of these sandwich samples. Electron microscopic and XRD investigations have revealed the polycrystalline nature of the deposited films.
제안 방법
A new metal-fullerite structure C60Pd3 has been found recently[6]. A series of new organometallic polymers, PdnC60, with varying Pd/C60 ratios was prepared and studied using the EXAFS spectroscopy. It was shown that the Pd atoms act as bridges between adjacent C60 molecules by coordination to the π-electrons of their double bonds.
The samples were investigated by IRS, ellipsometry, SP, and XRD, apart from measurements of the current/ voltage characteristics and the temperature dependence of conductivity. The absorption and transmission spectra have been obtained by the spectra-photometer SP-18 (λ = 400-750 nm), Fig.
0 μm. There were prepared three types of specimens each, the first one for the purpose of infrared spectroscopy (IRS), the second one for spectra-photometry (SP), ellipsometry and X-ray diffraction (XRD) studies, and die third one for the measurement of the current/voltage (I-V) characteristics and the study of the temperature dependence of conductivity.
The results indicate that silver diffused into the bulk of the fullerite film without increasing the film thickness. Under the assumption of a homogeneous distribution of silver atoms within the Ag/C60 structure the approximate correlation of silver atoms and C60 molecules was calculated by using the ellipsometric data. It appears that the approximate composition of such a structure is C60/Agx , where x= 12.
대상 데이터
The thickness of the fullerite film is then about 500 nm. The film has a dense structure with a mirror-like surface. The film structure as examined by SEM and TEM is polycrystalline, with the average size of the crystallites being around 200 to 300 nm.
The film has a dense structure with a mirror-like surface. The film structure as examined by SEM and TEM is polycrystalline, with the average size of the crystallites being around 200 to 300 nm. After that the thin metallic top contact layer was deposited by electron-beam evaporation (P= 10-3 Pa, td= 40 s).
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