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NTIS 바로가기Journal of semiconductor technology and science, v.17 no.4, 2017년, pp.543 - 551
Yoon, Changwook (Intel Corporation) , Chen, Bichen (EMC Laboratory, Missouri University of Science and Technology) , Ye, Xiaoning (Intel Corporation) , Fan, Jun (EMC Laboratory, Missouri University of Science and Technology)
SOL (Short, Open and Load) calibration based on iterative error sensitivity is proposed in this paper. With advanced SOL calibration, unknown parasitic parameters at on-chip terminations are accurately estimated up to 20 GHz. Artificial terminations are designed on printed circuit board (PCB) to exp...
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