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NTIS 바로가기반도체디스플레이기술학회지 = Journal of the semiconductor & display technology, v.20 no.2, 2021년, pp.109 - 114
이송연 (한국기술교육대학교대학원 메카트로닉스공학과) , 허용정 (한국기술교육대학교 메카트로닉스공학부)
When we inspect scaffold defect using sight, inspecting performance is decrease and inspecting time is increase. We need for automatically scaffold defect detection method to increase detection accuracy and reduce detection times. In this paper. We produced scaffold defect classification models usin...
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