[논문]물질이동 억제 버퍼층 형성을 통한 페로브스카이트 태양전지 장기 안정성 확보

배미선; 정민지; 장효식; 양태열

doi:10.6117/kmeps.2021.28.3.017

물질이동 억제 버퍼층 형성을 통한 페로브스카이트 태양전지 장기 안정성 확보
Long-term Stability of Perovskite Solar Cells with Inhibiting Mass Transport with Buffer Layers 원문보기

마이크로전자 및 패키징 학회지 = Journal of the Microelectronics and Packaging Society, v.28 no.3, 2021년, pp.17 - 24

배미선 (충남대학교 신소재공학과) , 정민지 (충남대학교 에너지과학기술대학원) , 장효식 (충남대학교 에너지과학기술대학원) , 양태열 (충남대학교 신소재공학과)

초록
AI-Helper

페로브스카이트 태양전지는 용액공정으로 제작되어 공정 중 전구체 조성제어를 통해 밴드갭을 용이하게 조절할 수 있다. 탠덤 태양전지의 상부셀로 활용하여 실리콘 태양전지와 접합 시 30% 이상의 효율 달성이 가능하지만, 페로브스카이트 태양전지의 낮은 안정성이 상용화의 걸림돌로 작용하고 있다. 아이오딘 이온 및 전극 물질 확산이 주된 열화기구로 알려져 있어 장기 안정성을 확보하기 위해서는 이러한 이온 이동의 방지가 필요하다. 본 연구에서는 층간소재와 페로브스카이트 광활성층 사이의 이온이동에 의한 열화현상을 관찰하고, 이를 억제하기 위해 페로브스카이트 소재와 은전극 사이에 버퍼층을 도입하여 소자의 안정성을 확보하였다. 85℃에서 300시간 이상 보관 시 버퍼가 없는 소자는 페로브스카이트 층이 PbI₂ 및 델타상으로 변화하며 변색되었으며 AgI가 형성되는 것을 확인했다. LiF와 SnO₂ 버퍼 도입 시 이온이동 억제 효과를 통해 페로브스카이트 태양전지의 열안정성이 향상되었다. LiF버퍼층 적용 및 봉지를 한 소자는 85℃-85%RH damp heat 시험 200시간 후 효율감소가 발생하지 않았으며 추가로 AM 1.5G-1SUN 하에서 최대출력점을 추적하였을 때 200시간 후 초기 효율의 90% 이상 유지하는 것을 확인했다. 이 결과는 버퍼층 형성을 통한 층간 물질이동 억제가 장기안정성을 확보하기 위한 필요조건임을 보여준다.

Abstract ▼ AI-Helper

Perovskite solar cells (PSCs) can be fabricated through solution process economically with variable bandgap that is controlled by composition of precursor solution. Tandem cells in which PSCs combined with silicon solar cells have potential to reach high power conversion efficiency over 30%, however, lack of long-term stability of PSCs is an obstacle to commercialization. Degradation of PSCs is mainly attributed to the mass transport of halide and metal electrode materials. In order to ensure the long-term stability, the mass transport should be inhibited. In this study, we confirmed degradation behaviors due to the mass transport in PSCs and designed buffer layers with LiF and/or SnO2 to improve the long-term stability by suppressing the mass transport. Under high-temperature storage test at 85℃, PSCs without the buffer layers were degraded by forming PbI2, AgI, and the delta phase of the perovskite material, while PSCs with the buffer layers showed improved stability with keeping the original phase of the perovskite. When the LiF buffer and encapsulation were applied to PSCs, superior long-term stability on 85℃-85% RH dump heat test was achieved; efficiency drop was not observed after 200 h. It was also confirmed that 90.6% of the initial efficiency was maintained after 200 hours of maximum power tracking test under AM 1.5G-1SUN illumination. Here, we have demonstrated that the buffer layer is essential to achieve long-term stability of PSCs.

주제어

표/그림 (6)

그림 Fig. 1. (a) Diagram of PSCs that shows possible degradation by the diffusion of silver and iodine through PCBM and BCP layers. (b) Photographs of a PSCs without buffer layers during the high-temperature storage at 85¡É. (top: as-prepared, middle: after 6days, and bottom: after 15days) The Yellow region indicates degradation of the perovskite active layer, which is observed around the edges of metal electrode fingers. (c) J-V curves of the as-prepared and the degraded devices after 15 days of high-temperature storage.
그림 Fig. 2. Comparison of performance factors, short circuit current density (J_SC), open circuit voltage (V_OC), fill factor (FF), and power conversion efficiency (PCE), of PSCs with a SnO₂ buffer layer which is prepared with different deposition temperature and various thickness. (140ºC 5 nm, 7.5 nm, 10 nm, 12.5 nm, 15 nm; 160ºC 5 nm)
그림 Fig. 3. (a) Devices structures and (b) initial efficiency of PSCs with or without LiF, SnO₂ buffer layers. (c) Photos of the PSCs with the buffer layers after 15 days of a thermal stability test at 85ºC in N₂ atmosphere under dark. No changes were observed from the backside. (d) Change in PCEs normalized by initial PCE values of PSCs with or without buffers during the thermal stability test.
$Fig. 4. X-ray diffraction (XRD) spectrum from PSCs with or without the buffer layers after 300 hours of aging at 85ºC. A Control device (Ctrl) has no buffer layer. The spectra of as-prepared (without the annealing at 85ºC) Ctrl device is displayed for comparison.$ 그림 Fig. 4. X-ray diffraction (XRD) spectrum from PSCs with or without the buffer layers after 300 hours of aging at 85ºC. A Control device (Ctrl) has no buffer layer. The spectra of as-prepared (without the annealing at 85ºC) Ctrl device is displayed for comparison.
그림 Fig. 5. Long-term stability of the PSC with a LiF buffer layer and encapsulation. (a) J-V curves of the PSC before and after 200 hours of storage at 85ºC and 85% relative humidity. (b) Maximum power point tracking test of the PSC for 200 hours under AM 1.5G- 1SUN illumination.
표 Table 1. Comparison of peak-intensity ratio of PbI₂ (001) /perovskite (100) from XRD spectrum in Fig. 4.

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