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NTIS 바로가기IEEE Solid-State Circuits Society news, v.13 no.1, 2008년, pp.50 - 56
Foss, R.C. (Mosaid Technologies, Inc.)
Based on his work in the design, specification and test of DRAM for over thirty years, Dr. Richard Foss charts the crucial role of Dynamic Random Access Memory in the intertwined development of the computer and semiconductor industries, and highlights the influence of Moore's Law, whose tentacles re...
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