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Performance Assessment of III–V Channel Ultra-Thin-Body Schottky-Barrier MOSFETs

IEEE electron device letters : a publication of the IEEE Electron Devices Society, v.35 no.7, 2014년, pp.726 - 728  

Jaehyun Lee (Dept. of Electr. Eng., Korea Adv. Inst. of Sci. & Technol., Daejeon, South Korea) ,  Mincheol Shin (Dept. of Electr. Eng., Korea Adv. Inst. of Sci. & Technol., Daejeon, South Korea)

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The performance of III-V channel ultra-thin-body Schottky barrier (SB) MOSFETs is assessed by quantum mechanical simulations. All the Gamma-, L-, and Delta-valleys are included in the calculations, with their effective masses adjusted by the sp(3)d(5)s* tight-binding method. Our results show that In...

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참고문헌 (20)

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