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NTIS 바로가기IEEE electron device letters : a publication of the IEEE Electron Devices Society, v.39 no.5, 2018년, pp.672 - 675
Padovani, Andrea (MDLab s.r.l., Reggio Emilia, Italy) , Woo, Jiyong (Department of Materials Science and Engineering, Pohang University of Science and Technology, Pohang, South Korea) , Hwang, Hyunsang (Department of Materials Science and Engineering, Pohang University of Science and Technology, Pohang, South Korea) , Larcher, Luca (Dipartimento di Scienze e Metodi dell’Ingegneria, Universita di Modena e Reggio Emilia, Reggio Emilia, Italy)
We use experiments and device simulations to investigate pulsed SET operation of HfO2-based RRAM devices for their possible use as electronic synapses. The application of a train of identical pulses only allows for an abrupt change of the device current, which is not suitable for synaptic devices. B...
Woo, Jiyong, Moon, Kibong, Song, Jeonghwan, Lee, Sangheon, Kwak, Myounghun, Park, Jaesung, Hwang, Hyunsang. Improved Synaptic Behavior Under Identical Pulses Using AlOx/HfO2 Bilayer RRAM Array for Neuromorphic Systems. IEEE electron device letters : a publication of the IEEE Electron Devices Society, vol.37, no.8, 994-997.
Ginestra Software 2017
Padovani, Andrea, Larcher, Luca, Pirrotta, Onofrio, Vandelli, Luca, Bersuker, Gennadi. Microscopic Modeling of HfOx RRAM Operations: From Forming to Switching. IEEE transactions on electron devices, vol.62, no.6, 1998-2006.
Ielmini, D.. Modeling the Universal Set/Reset Characteristics of Bipolar RRAM by Field- and Temperature-Driven Filament Growth. IEEE transactions on electron devices, vol.58, no.12, 4309-4317.
Long, Shibing, Lian, Xiaojuan, Cagli, Carlo, Perniola, Luca, Miranda, Enrique, Liu, Ming, Suñé, Jordi. A Model for the Set Statistics of RRAM Inspired in the Percolation Model of Oxide Breakdown. IEEE electron device letters : a publication of the IEEE Electron Devices Society, vol.34, no.8, 999-1001.
Raghavan, N.. Application of the defect clustering model for forming, SET and RESET statistics in RRAM devices. Microelectronics reliability, vol.64, 54-58.
Lanza, Mario. A Review on Resistive Switching in High-k Dielectrics: A Nanoscale Point of View Using Conductive Atomic Force Microscope. Materials, vol.7, no.3, 2155-2182.
Nminibapiel, David M., Veksler, Dmitry, Shrestha, Pragya R., Kim, Ji-Hong, Campbell, Jason P., Ryan, Jason T., Baumgart, Helmut, Cheung, Kin P.. Characteristics of Resistive Memory Read Fluctuations in Endurance Cycling. IEEE electron device letters : a publication of the IEEE Electron Devices Society, vol.38, no.3, 326-329.
Nminibapiel, David M., Veksler, Dmitry, Shrestha, Pragya R., Campbell, Jason P., Ryan, Jason T., Baumgart, Helmut, Cheung, Kin P.. Impact of RRAM Read Fluctuations on the Program-Verify Approach. IEEE electron device letters : a publication of the IEEE Electron Devices Society, vol.38, no.6, 736-739.
IEEE IEDM Tech Dig Phase change memory as synapse for ultra-dense neuromorphic systems: Application to complex visual pattern extraction suri 2011 4.4.1
Kuzum, Duygu, Yu, Shimeng, Philip Wong, H-S. Synaptic electronics: materials, devices and applications. Nanotechnology, vol.24, no.38, 382001-.
Ielmini, D., Nardi, F., Balatti, S.. Evidence for Voltage-Driven Set/Reset Processes in Bipolar Switching RRAM. IEEE transactions on electron devices, vol.59, no.8, 2049-2056.
Shimeng Yu, Yi Wu, Jeyasingh, R., Kuzum, D., Wong, H. P.. An Electronic Synapse Device Based on Metal Oxide Resistive Switching Memory for Neuromorphic Computation. IEEE transactions on electron devices, vol.58, no.8, 2729-2737.
Merolla, Paul A., Arthur, John V., Alvarez-Icaza, Rodrigo, Cassidy, Andrew S., Sawada, Jun, Akopyan, Filipp, Jackson, Bryan L., Imam, Nabil, Guo, Chen, Nakamura, Yutaka, Brezzo, Bernard, Vo, Ivan, Esser, Steven K., Appuswamy, Rathinakumar, Taba, Brian, Amir, Arnon, Flickner, Myron D., Risk, William P., Manohar, Rajit, Modha, Dharmendra S.. A million spiking-neuron integrated circuit with a scalable communication network and interface. Science, vol.345, no.6197, 668-673.
Garbin, Daniele, Vianello, Elisa, Bichler, Olivier, Rafhay, Quentin, Gamrat, Christian, Ghibaudo, Gerard, DeSalvo, Barbara, Perniola, Luca. HfO2-Based OxRAM Devices as Synapses for Convolutional Neural Networks. IEEE transactions on electron devices, vol.62, no.8, 2494-2501.
Jiyong Woo, Padovani, Andrea, Kibong Moon, Myounghun Kwak, Larcher, Luca, Hyunsang Hwang. Linking Conductive Filament Properties and Evolution to Synaptic Behavior of RRAM Devices for Neuromorphic Applications. IEEE electron device letters : a publication of the IEEE Electron Devices Society, vol.38, no.9, 1220-1223.
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