An example system includes a receptacle to house a device under test (DUT); an antenna for exchanging signals with the DUT, where at least some of the signals are for use in performing radiated testing of the DUT; and a cap configured to mate to the receptacle to form a housing to enclose the DUT. T
An example system includes a receptacle to house a device under test (DUT); an antenna for exchanging signals with the DUT, where at least some of the signals are for use in performing radiated testing of the DUT; and a cap configured to mate to the receptacle to form a housing to enclose the DUT. The housing is for isolating the DUT at least one of physically or electromagnetically.
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1. A system comprising: a receptacle to house a device under test (DUT), the receptacle comprising walls that are configured for placement over and to surround a socket that holds the DUT, the socket being part of a device interface board (DIB) of a test system that is separate from the receptacle;a
1. A system comprising: a receptacle to house a device under test (DUT), the receptacle comprising walls that are configured for placement over and to surround a socket that holds the DUT, the socket being part of a device interface board (DIB) of a test system that is separate from the receptacle;an antenna in the receptacle for exchanging signals with the DUT, at least some of the signals for use in performing radiated testing of the DUT; anda cap configured to mate to the receptacle to form a housing to enclose the DUT, the housing, including the receptacle, being separate from the socket and being for isolating the DUT at least one of physically or electromagnetically;wherein the DIB is originally configured to support conductive testing of the DUT but not radiated testing, and wherein the system is installable on the DIB to reconfigure the DIB to support contemporaneous radiated testing of the DUT. 2. The system of claim 1, wherein the system is configured to connect to the DIB, the DIB comprising one or more other sockets to receive one or more other DUTs, the housing for isolating the DUT from the one or more other DUTs. 3. The system of claim 2, wherein the DIB comprises a legacy DIB that is also configurable for use absent the housing and outside a context of radiated testing. 4. The system of claim 1, wherein the housing is for isolating the DUT both physically and electromagnetically from one or more of the following: other DUTs, dielectric materials, metallic materials, or magnetic materials. 5. The system of claim 1, wherein the cap comprises a plunger that is movable within the receptacle to apply pressure to the DUT to cause the DUT to connect to the socket. 6. The system of claim 1, wherein an antenna is arranged to a side of the socket. 7. The system of claim 1, wherein each of multiple antennas are arranged on a side of the socket. 8. The system of claim 1, wherein an antenna arranged is underneath at least one of the DUT or the DIB. 9. The system of claim 8, wherein an antenna is underneath the DUT. 10. The system of claim 8, wherein an antenna is underneath the DIB. 11. The system of claim 8, wherein an antenna is part of the DIB. 12. The system of claim 8, wherein the DUT has a surface comprising electrical connections, the cap comprising a plunger configured to hold the DUT by the surface containing the electrical connections and to mount the DUT such that the electrical connections face away from the socket; and wherein the system comprises one or more electrical conduits to connect to the electrical connections. 13. The system of claim 1, wherein the cap comprises a plunger to contact the DUT; and further comprising an antenna within the plunger. 14. The system of claim 13, wherein the plunger is directly above the socket, and is configured to move within the receptacle relative to the socket. 15. The system of claim 1, wherein the cap comprises a plunger to contact the DUT; and wherein the plunger is comprised of a material having one or more of electrical properties. 16. The system of claim 15, wherein the one or more electrical properties comprise ranges of dielectric permittivity, permeability, or conductivity. 17. The system of claim 15, wherein the material comprises, at least in part, polyether ether ketone (PEEK). 18. The system of claim 1, wherein the cap comprises a plunger to contact the DUT; and wherein the plunger has multiple holes along at least part of a longitudinal dimension of the plunger. 19. The system of claim 1, wherein the cap comprises a plunger to contact the DUT; and wherein the plunger has a single hole along at least part of a longitudinal dimension of the plunger. 20. The system of claim 1, wherein the cap comprises a plunger to contact the DUT; and wherein the plunger is hollow along at least part of a longitudinal dimension of the plunger. 21. The system of claim 1, wherein an interior of the housing is lined, at least in part, with a material for suppressing echoes. 22. The system of claim 20, wherein the plunger comprises a vacuum channel for holding the DUT via suction during transport to the receptacle. 23. The system of claim 1, wherein the housing is configured to house the DUT and at least one other DUT, the DUT being isolated electromagnetically from the at least one other DUT through signals having different frequency bands. 24. The system of claim 23, wherein signals exchanged with the DUT are in a first frequency band, signals exchanged with the at least one other DUT are in at least one second frequency band, and the first frequency band is different from the at least one second frequency band. 25. The system of claim 1, wherein the system is part of a change kit configured to connect to the DIB, the DIB comprising test sockets configured for performing non-radiated testing, the change kit for adapting at least one of the test sockets to perform radiated testing on the DUT. 26. A system comprising: a device interface board (DIB) for interfacing to a test system, the DIB comprising sockets, each of the sockets for receiving a device under test (DUT), where the DIB is configured to enable conductive testing of each DUT and radiated testing of each DUT;receptacles, each of the receptacles being for a different one of the sockets, each receptacle comprising walls that are configured for placement over and to surround a different one of the sockets, each receptacle being separate from the different one of the sockets;antennas, ones of the antennas being within respective receptacles and each one being associated with a different one of the sockets, each antenna for exchanging signals with a DUT in a socket, at least some of the signals for use in performing radiated testing of the DUT in the socket; anda cap configured to mate to the receptacles to form a separate housing for, and enclosing, each one of the DUTs, each separate housing isolating a DUT enclosed in the housing at least one of physically or electromagnetically;wherein the DIB is originally configured to support conductive testing of the DUT but not radiated testing, and wherein the receptacles, antennas, and cap are installable on the DIB to reconfigure the DIB also to support contemporaneous radiated testing of the DUT. 27. The system of claim 26, wherein the cap comprises one or more plungers, each of the one or more plungers for holding, and contacting, a DUT in a separate socket. 28. The system of claim 26, wherein, for a housing among the separate housings, an antenna is located to a side of a socket on the DIB. 29. The system of claim 26, wherein, for a housing among the separate housings, an antenna is located underneath a DUT on the DIB. 30. The system of claim 26, wherein, for a housing among the separate housings, an antenna is located directly above a socket on the DIB. 31. The system of claim 26, wherein the cap comprises a plunger for each separate housing, the plunger having multiple holes along at least part of a longitudinal dimension of the plunger. 32. The system of claim 26, wherein the cap comprises a plunger for each separate housing, the plunger having a single hole along at least part of a longitudinal dimension of the plunger. 33. The system of claim 26, wherein the cap comprises a plunger for each separate housing, the plunger being hollow along at least part of a longitudinal dimension of the plunger. 34. The system of claim 26, wherein each separate housing is for isolating a DUT enclosed in the housing at least one of physically or electromagnetically from other DUTs in other ones of the housings. 35. The system of claim 26, wherein the system is part of a change kit configured to adapt the sockets of the DIB to perform radiated testing on the DUTs.
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