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NTIS 바로가기마이크로전자 및 패키징 학회지 = Journal of the Microelectronics and Packaging Society, v.30 no.1, 2023년, pp.55 - 62
서영진 (충북대학교 신소재공학과) , 허민행 (충북대학교 신소재공학과) , 윤정원 (충북대학교 신소재공학과)
In this study, Sn-3.0Ag-0.5Cu (wt.%, SAC305) solder dipping process was performed between Ni-foam skeleton with different pore per inch (PPI) to fabricate Ni-foam/SAC305 composite solder, and then applied to the transient liquid phase (TLP) bonding process to evaluate the microstructure and mechanic...
K. Y. Kim, K. D. Min, Y. I. Kim, J. W. Yoon, and S. B. Jung,?"The effect of environmental test on the shear strength of the?ultrasonic bonded Cu terminal for power module", J. Weld.?Join., 37(2), 1-6 (2019).
D. H. Jung, M. H. Roh, J. H. Lee, K. H. Kim, and J. P. Jung,?"Transient Liquid Phase (TLP) Bonding of device for high?temperature operation", J. Microelectron. Electron. Packag.,?24(1), 17-25 (2017).
S. J. Baek, G. W. Jeong, J. H. Son, M. S. Kim, H. B. R. Lee,?J. S. Kim, and Y. H. Ko, "Interfacial re actions and mechanical properties of transient liquid-phase bonding joints in Cu/Sn/Ni (P) and Ni/Sn/(OSP) Cu structures for power modules", J. Mater. Sci.: Mater. Electron, 32, 3324-3333 (2021).
Y. Cheon, "Review of global carbon neutral strategies and?technologies", J. Korean Soc., 59(1), 99-112 (2022).
J. W. Yoon, J. H. Bang, Y. H. Ko, S. H. Yoo, J. K. Kim, and?C. W. Lee, "Power module packaging technology with?extended reliability for electric vehicle applications", J.?Microelectron. Electron. Packag., 21(4), 1-13 (2014).
H. J. Kang and J. P. Jung, "TLP and wire bonding for power?module", J. Microelectron. Electron. Packag., 26(4), 7-13 (2019).
I. Nistor, A. Mihaila, M. Rahimo, L. Storasta, and C. Corvasce, "Wide bandgap power devices in megawatt applications", Power Electronics Europe, 4, 35 (2012).
M. K. Kim and S. W. Yoon, "Miniaturized design of a piezoelectric thermal sensor optimized for the integration to wide?bandgap power modules operating at high temperatures",?In 2017 IEEE Applied Power Electronics Conference and?Exposition (APEC), 767-771 (2017).
L. Yang, Y. Xiong, Y. Zhang, W. Jiang, and D. Wei, "Microstructure and shear property of In-Sn-xAg solder joints fabricated by TLP bonding", J. Mater. Sci.: Mater. Electron., 30,?18211-18219 (2019).
W. S. Hong and C. M. Oh, "Degradation behavior of solder?joint and implementation technology for lead-free automotive?electronics", J. Weld. Join., 31(3), 22-30 (2013).
J. H. Son, M. K. Kim, D. Y. Yu, Y. H. Ko, J. W. Yoon, C.?W. Lee, Y. B. Park, and J. H. Bang, "Thermal aging characteristics of Sn-xSb solder for automotive power module", J.?Weld. Join., 35(5), 38-47 (2017).
N. Y. Lee, J. H. Lee, and C. Y. Hyun, "Chip sinter-bonding?using Ag-based paste for power semiconductor devices", J.?Weld. Join., 37(5), 482-492 (2019).
H. Feng, J. Huang, X. Peng, Z. Lv, Y. Wang, J. Yang, S. Chen,?and X. Zhao, "Microstructural evolution of Ni-Sn transient?liquid phase sintering bond during high-temperature aging",?J. Electron. Mater., 47, 4642-4652 (2018).
H. Xu, Y. Shen, Y. Hu, J. Li, and J. Xu, "Fabrication of highly?reliable joint based on Cu/Ni/Sn double-layer powder for high?temperature application", J. Microelectron. Electron. Packag.,?16(4), 188-195 (2019).
J. F. Silvain, L. Constantin, J. M. Heintz, S. Bordere, L. Teule-Gay, Y. F. Lu, J. L. Diot, R. D. Langlade, and E. Feuillet,?"Controlling interfacial exchanges in liquid phase bonding?enables formation of strong and reliable Cu-Sn soldering for?high-power and temperature applications", ACS Appl. Electron. Mater., 3(2), 921-928 (2021).
D. Ishikawa, B. N. An, M. Mail, H. Wurst, B. Leyrer, T.?Blank, M. Weber, S. Ueda, H. Nakako, and Y. Kawana,?"Analysis of bonding interfaces of pressureless-sintered Cu?on metallization layers", In 2019 International Conference on?Electronics Packaging (ICEP), 167-172 (2019).
D. H. Lee, M. H. Heo, and J. W. Yoon, "Recent studies of?transient liquid phase bonding technology for electric vehicles", J. Weld. Join., 40(3), 233-241 (2022).
J. H. Lee, D. H. Jung, and J. P. Jung, "Transient liquid phase?diffusion bonding technology for power semiconductor packaging", J. Microelectron. Electron. Packag., 25(4), 9-15 (2018).
Z. Li, M. Li, Y. Xiao, and C. Wang, "Ultrarapid formation of?homogeneous Cu6Sn5 and Cu3Sn intermetallic compound?joints at room temperature using ultrasonic waves", Ultrason?Sonochem., 21(3), 924-929 (2014).
J. W. Yoon, M. H. Heo, Y. J. Seo, D. H. Lee, M. S. Jeong,?and H. T. Kim, "Semiconductor device bonding material comprising solder-coated metal foam", Korea patent 10-2022-0126915, filed October 4, 2022.
W. Zhang, Y. Cao, J. Huang, W. Zhao, X. Liu, M. Li, and H.?Ji, "Ultrasonic-accelerated metallurgical reaction of Sn/Ni?composite solder: Principle, kinetics, microstructure, and joint?properties", Ultrason Sonochem., 66, 105090 (2020).
H. Feng, J. Huang, J. Zhang, X. Zhai, X. Zhao, and S. Chen,?"High temperature resistant Ni-Sn transient liquid phase sintering bonding for new generation semiconductor power electronic devices", In 2015 IEEE 17th Electronics Packaging and?Technology Conference (EPTC), 1-4 (2015).
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