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NTIS 바로가기IEEE transactions on components, packaging, and manufacturing technology, v.4 no.4, 2014년, pp.697 - 707
Joohee Kim (Dept. of Electr. Eng., Korea Adv. Inst. of Sci. & Technol., Daejeon, South Korea) , Jonghyun Cho (Dept. of Electr. Eng., Korea Adv. Inst. of Sci. & Technol., Daejeon, South Korea) , Joungho Kim (Dept. of Electr. Eng., Korea Adv. Inst. of Sci. & Technol., Daejeon, South Korea) , Jong-Min Yook (Syst. Package Res. Center, KETI, Seoul, South Korea) , Jun Chul Kim (Syst. Package Res. Center, KETI, Seoul, South Korea) , Junho Lee (Adv. Design Team, Hynix Semicond. Inc., Icheon, South Korea) , Kunwoo Park (Adv. Design Team, Hynix Semicond. Inc., Icheon, South Korea) , Jun So Pak (Dept. of Electr. Eng., Korea Adv. Inst. of Sci. & Technol., Daejeon, South Korea)
An analytic scalable model of a differential signal through-silicon via (TSV) is proposed. This TSV is a ground-signal-signal-ground (GSSG)-type differential signal TSV. Each proposed analytical equation in the model is a function of the structural and material design parameters of the TSV and the b...
Ki Jin Han, Swaminathan, M, Bandyopadhyay, T. Electromagnetic Modeling of Through-Silicon Via (TSV) Interconnections Using Cylindrical Modal Basis Functions. IEEE transactions on advanced packaging : a publication of the IEEE Components, Packaging, and Manufacturing Technology Society and the Lasers and Electro Optics Society, vol.33, no.4, 804-817.
Katti, G., Stucchi, M., De Meyer, K., Dehaene, W.. Electrical Modeling and Characterization of Through Silicon via for Three-Dimensional ICs. IEEE transactions on electron devices, vol.57, no.1, 256-262.
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Tang, K.T., Friedman, E.G.. Simultaneous switching noise in on-chip CMOS power distribution networks. IEEE transactions on very large scale integration (VLSI) systems, vol.10, no.4, 487-493.
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Stellari, F., Lacaita, A.L.. New formulas of interconnect capacitances based on results of conformal mapping method. IEEE transactions on electron devices, vol.47, no.1, 222-231.
Eisenstadt, W.R., Eo, Y.. S-parameter-based IC interconnect transmission line characterization. IEEE transactions on components, hybrids, and manufacturing technology, vol.15, no.4, 483-490.
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