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Solid-state electronics, v.116, 2016년, pp.60 - 64
Lin, Q. , Zhao, C. , Sheng, N.
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This paper studies the hydrogen-induced program state threshold voltage degradation in SONOS wafers, which ultimately impacts wafer sort test yield. During wafer sort step, all individualintegrated circuits noted as dieare tested for functional defects by applying specialtest patternsto them. The pr...
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