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NTIS 바로가기Journal of semiconductor technology and science, v.13 no.4, 2013년, pp.342 - 354
Verma, Neha (Microelectronics Research Laboratory, Department of Electronic Science, A.R.S.D College, University of Delhi, South Campus) , Gupta, Mridula (Semiconductor Device Research Laboratory, Department of Electronic Science, University of Delhi, South Campus) , Gupta, R.S. (Department of Electronics and Communication Engineering, Maharaja Agrasen Institute of Technology) , Jogi, Jyotika (Microelectronics Research Laboratory, Department of Electronic Science, A.R.S.D College, University of Delhi, South Campus)
The aim of this work is to investigate and study the quantum effects in the modeling of nanoscale symmetric double-gate InAlAs/InGaAs/InP HEMT (High Electron Mobility Transistor). In order to do so, the carrier concentration in InGaAs channel at gate lengths (
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